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Multi-frequency-structured-light-based three-dimensional measuring device and method thereof

A three-dimensional measurement and structured light technology, applied in the field of optical detection, can solve the problems of single projection measurement device being easily affected by light and shadow, increasing hardware cost and time consumption, low measurement accuracy, etc., to eliminate shadow effect and improve sine Accuracy and the effect of improving projection efficiency

Active Publication Date: 2019-11-26
FOSHAN NANHAI GUANGDONG TECH UNIV CNC EQUIP COOP INNOVATION INST +1
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Problems solved by technology

The existing dual-frequency heterodyne phase solution method is limited by the frequency of the fringe grating, and the measurement accuracy is not high. The single-projection measurement device is easily affected by light and shadow, and the multi-eye measurement will greatly increase the hardware cost and time consumption.

Method used

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  • Multi-frequency-structured-light-based three-dimensional measuring device and method thereof

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Embodiment 1

[0061] like figure 1 and figure 2 As shown, this embodiment discloses a multi-frequency structured light three-dimensional measurement device, the three-dimensional measurement device mainly includes a loading platform, a support rod, a fastening bracket, an X-axis slide rail, a Y-axis slide rail, a grating projector, a camera , and a collection device for collecting images of the measured object. The loading platform is fixedly arranged. One end of the support rod is installed on the loading platform, and the other end extends vertically upwards and is connected with the fastening bracket. The fastening bracket is arranged on the support rod, is slidably connected with the support rod and can be locked on the support rod. The X-axis slide rail is fixed on the fastening bracket and arranged vertically on the fastening bracket. The camera is installed downwards on the X-axis slide rail, and is electrically connected to the grating projector and the acquisition device respe...

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Abstract

The invention discloses a multi-frequency-structured-light-based three-dimensional measuring device and a method thereof. The three-dimensional measuring device mainly comprises a carrying platform, asupporting rod, a fastening support, an X-axis sliding rail, a Y-axis sliding rail, a grating projector, a camera and a collecting device for collecting an image of a measured object. In addition, the measuring method mainly includes the following steps: S11, calibrating a mechanical position of the imaging system; S12, calibrating equipment; S13, calculating internal and external parameters of the camera and the grating projector; S21, triggering the camera to collect the image; S22, carrying out phase unwrapping; S23, registering left and right projection data; and S24, performing three-dimensional reconstruction according to a point cloud. According to the invention, with a high-frame-rate DLP projector, the sinusoidal precision of the projection grating can be effectively improved andthe projection efficiency of the grating can be enhanced. Besides, the three-dimensional coordinate of the object is calculated by using the four-step phase shift and five-frequency iterative algorithm, so that the precision can be improved to be 0.005 mm.

Description

technical field [0001] The invention relates to the technical field of optical detection, in particular to a multi-frequency structured light three-dimensional measuring device and a measuring method. Background technique [0002] Three-dimensional shape measurement is widely used in fields such as industry, agriculture, biomedicine, cultural relics protection, and reverse engineering. The structured light measurement technology in active measurement has been paid more and more attention due to its inherent non-contact, high precision, fast speed, and easy implementation. Among them, the method of phase unwrapping is a hot and difficult point of research by Chinese and foreign researchers. . The existing dual-frequency heterodyne phase solution method is limited by the frequency of the fringe grating, and the measurement accuracy is not high. The single-projection measurement device is easily affected by light and shadow, and the multi-eye measurement will greatly increase ...

Claims

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Application Information

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IPC IPC(8): G01B11/25
CPCG01B11/254
Inventor 王华龙李凡毛骁
Owner FOSHAN NANHAI GUANGDONG TECH UNIV CNC EQUIP COOP INNOVATION INST
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