Light-emitting element and manufacturing method therefor
A technology of light-emitting components and manufacturing methods, which is applied in the direction of electrical components, semiconductor devices, circuits, etc., can solve problems such as the reduction of light extraction efficiency, and achieve the effect of improving light extraction efficiency
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no. 1 approach
[0062] Light-emitting component of the first embodiment
[0063] First, a light emitting module according to a first embodiment of the present invention will be described.
[0064] Figure 10 A schematic diagram showing the light-emitting component 1000 of the present invention before scribing.
[0065] Such as Figure 10 As shown, in the light-emitting module of the first embodiment of the present invention, the transparent substrate as the window layer and supporting substrate 120 made of GaP, GaAsP, sapphire, etc. is formed on the surface of the transparent substrate (window layer and supporting substrate 120). The second dielectric film 122 having a thickness of 0.05 to 1.0 μm and the first dielectric film 112 having the same thickness of 0.05 to 1.0 μm are formed. As the dielectric film, SiO can be used 2 or SiN x .
[0066] On the first dielectric film 112, an antireflection layer 111 (AR layer) having a function of preventing light reflection is arranged.
[0067...
Embodiment 1
[0134] will be like Figure 10 The light-emitting components before scribing are scribed to manufacture 10,000 light-emitting components. Specifically, on the window layer and supporting substrate made of GaP, a layer made of SiO 2 The formed second dielectric film with a thickness of 0.5 μm is also made of SiO 2 The formed first dielectric film with a thickness of 0.5 μm and the TiO 2 (refractive index: 2.493), further forming a light-emitting portion, the light-emitting portion sequentially includes a current diffusion layer made of AlGaAs with a thickness of 1.0 μm, an intermediate composition layer made of AlInP with a thickness of 0.5 μm, A p-type second semiconductor layer with a thickness of 1.0 μm, an active layer with a thickness of 0.5 μm, and an n-type first semiconductor layer with a thickness of 1.0 μm are made of AlGaInP. Furthermore, it has the removed part from which the active layer and the 1st semiconductor layer of the 1st conductivity type were removed, ...
Embodiment 2
[0137] will be like Figure 20 The light-emitting components shown before scribing were scribed, and 10,000 light-emitting components were manufactured. Specifically, on the window layer and supporting substrate made of GaP, a layer made of SiO 2 The formed second dielectric film with a thickness of 0.5 μm is also made of SiO 2 The formed first dielectric film with a thickness of 0.5 μm and the TiO 2 The resulting antireflection layer is further formed with a light-emitting portion, which sequentially includes a current diffusion layer made of AlGaAs with a thickness of 1.0 μm, an intermediate composition layer made of AlInP with a thickness of 0.5 μm, and a current diffusion layer made of AlGaInP. A p-type second semiconductor layer with a thickness of 1.0 μm, an active layer with a thickness of 0.5 μm, and an n-type first semiconductor layer with a thickness of 1.0 μm, further, remove the active layer and the first semiconductor layer of the first conductivity type. parts...
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Abstract
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