A target room system with main and auxiliary room structure for circuit board testing and its application method

Abstract

The invention discloses a main and auxiliary chamber structure target chamber system for circuit board testing and a method for using the same, and the system comprises the following parts of a systemstand; a main target chamber fixed on the system stand, wherein the required degree of vacuum satisfying the circuit board testing is provided in the main target chamber, a four-dimensional positioning platform is provided on the lower bottom plate of the main target chamber, and a circuit board receiving rack is provided on the four-dimensional positioning platform; at least one auxiliary chamber connected to the interface left on the main target chamber through a pneumatic valve, wherein the bottom of the auxiliary chamber is provided with a vacuuming device connected to the inner chamber;a circuit board transmission mechanism connected to the auxiliary chamber and comprising circuit board fixing frames distributed in the auxiliary chamber, and a transmission component fixedly disposedon the auxiliary chamber, wherein a circuit board to be tested is mounted on the circuit board fixing frames, and one end of the transmission component extends into the auxiliary chamber and is connected to the circuit board fixing frames; and a programmable logic controller control box connected to the vacuuming device and the transmission component.

Description

technical field [0001] The present invention relates to a target chamber system with a main and auxiliary chamber structure for circuit board testing and a method for using the same, in particular to a system for replacing a circuit board to be tested without destroying the vacuum degree of the main target chamber by using the auxiliary chamber. The use method belongs to the technical field of replacing circuit boards to be tested in accelerator vacuum irradiation tests. Background technique [0002] The Lanzhou Heavy Ion Cyclotron is an important device for testing single event effects in my country. However, due to the limited beam time that can be used for testing each year, it is far from meeting the growing demand for single event effects testing. Therefore, it is necessary to make full use of the limited beam time. Limited by the ion energy of the accelerator, the single event effect test of some heavier ions should be completed in a vacuum environment. The test in va...

AI Technical Summary

Problems solved by technology

The test in vacuum needs to put the test circuit board with the device under test into the vacuum target chamber. After the vacuum target chamber has been evacuated for a long time until the vacuum degree reaches the required level, the vacuum valve connected to the accelerator is allowed to be opened; The sample can only be taken out after the molecular pump is completely stopped and deflated; every time a device is replaced, the above process is repeated, which makes the test very time-consuming and the utilization efficiency of the test beam is low

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