A Phased Array Ultrasonic Inspection System and Method for Unconnected Defects between Skin and Lattice Endpoints of Additive Manufacturing Lattice Structure
A technology of ultrasonic testing and lattice structure, which is applied in the analysis of solids using sonic/ultrasonic/infrasonic waves, material analysis using sonic/ultrasonic/infrasonic waves, and measurement devices, etc., to improve detection efficiency and detection flexibility, prevent damage, and improve imaging. Display intuitive effects
Active Publication Date: 2022-02-01
BEIJING XINGHANG MECHANICAL ELECTRICAL EQUIP
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[0005] The present invention proposes a phased array ultrasonic detection system and method for the unconnected defect between the skin and the end point of the lattice structure in additive manufacturing, to solve how to intuitively detect the unconnected defect between the skin and the end point of the lattice, and prevent the products of this structure from being Technical problems caused by damage during use
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[0028] In order to make the purpose, content and advantages of the present invention clearer, the specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.
[0029] This embodiment proposes a phased array ultrasonic detection system for additively manufactured lattice structure skin and unconnected defects at lattice ends, such as figure 1 As shown, the ultrasonic detection system includes a scanning module 100 and an image analysis module 200 . Among them, the scanning module 100 is used to scan the skin of the lattice structure of additive manufacturing, obtain the ultrasonic C-scan imaging of the skin of the lattice structure and the endpoint of the lattice and send it to the image analysis module 200; the image analysis module 200 is used for Analyze and judge the received ultrasonic C-scan imaging.
[0030] Such as figure 2 As shown, the scanning module 100 includes ...
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The invention belongs to the technical field of non-destructive testing of metal materials in additive manufacturing, and in particular relates to a phased array ultrasonic testing system and method for unconnected defects of lattice structure skin and lattice end points in additive manufacturing. The detection system includes a scanning module and an image analysis module; among them, the scanning module is used to scan the additively manufactured lattice structure skin, obtain the lattice structure skin and the ultrasonic C-scan image at the end point of the lattice, and send it to An image analysis module; the image analysis module is used for analyzing and judging the received ultrasonic C-scan imaging. The invention can more intuitively detect the unconnected defect of the skin and the dot matrix end point, and prevent the workpiece from being damaged during use; not only can the product detection be accurately completed, but also the detection efficiency and detection flexibility are greatly improved.
Description
technical field [0001] The invention belongs to the technical field of non-destructive testing of metal materials in additive manufacturing, and in particular relates to a phased array ultrasonic testing system and method for unconnected defects of lattice structure skin and lattice endpoints in additive manufacturing. Background technique [0002] There are special industry standards for ultrasonic detection of metal skin and honeycomb connection structures, and there are corresponding standards in the aviation industry, but there is no special standard for the detection of unconnected defects between the skin and the end of the lattice structure in additive manufacturing. The selection of detection methods, design of probe wedges, frequency selection and evaluation of defects caused certain technical difficulties, which made the detection impossible. During the detection, the staff did not know which probe and detection method to choose for detection, resulting in a lot of ...
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IPC IPC(8): G01N29/06G01N29/28G01N29/22G01N29/265
CPCG01N29/0645G01N29/28G01N29/22G01N29/265G01N2291/0234G01N2291/105
Inventor 刘钊张红梅张祥林唐增武苏晓文钱远宏陈刚
Owner BEIJING XINGHANG MECHANICAL ELECTRICAL EQUIP