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Detection structure and method of ATE system

A detection method and technology of detection structure, which are applied in the direction of measuring electricity, measuring device, short-circuit test, etc., can solve the problems of inability to accurately locate the location of the fault channel, high design cost, low efficiency, etc., and achieve automatic testing, low hardware cost, The effect of saving pin resources

Inactive Publication Date: 2020-01-14
SHANGHAI NCATEST TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, there are often hundreds or even thousands of OD gate test channels in the entire ATE test system. If you want to test the quality of each channel individually, you need a large number of hardware detection pins, and the design cost is high.
The current detection structure and method have defects such as inability to accurately locate the fault channel location, low efficiency, or some fault blind spots.

Method used

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  • Detection structure and method of ATE system
  • Detection structure and method of ATE system
  • Detection structure and method of ATE system

Examples

Experimental program
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Effect test

Embodiment 1

[0041] as attached Figure 5 As shown, the opening and closing of the test channel is controlled by the OD gate, and the OD gate is an NMOSFET tube, where Q 1 to Q n On behalf of the switch, when the control signal sent by the controller is high, the corresponding Q m conduction, so that the test channel is opened; when the control signal sent by the controller is low, the corresponding Q m Turn off, the test channel outputs high impedance, which makes the test channel turn off.

[0042] Measure the bus current I by using the pressurized current measurement function of the PE chip in the ATE system on the load board bus The change of the test channel can be judged whether it is normal or not. If the voltage applied by PE to the bus is V bus , resistor R 1 =…=R n =R. Under normal circumstances, the corresponding current change after a single channel is turned on: ΔI=V bus / R controls R and V bus The size of ΔI makes the ΔI skill meet the flow capacity required by the ...

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PUM

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Abstract

The invention discloses a detection structure of an ATE system. The structure comprises a test resource board and a load board. The test resource board comprises a controller and n test channels connected with the controller. The load board comprises a detection unit, a bus and n resistors with a same resistance value R. The n test channels are connected with one ends of the n resistors, and the other ends of the n resistors are connected to the detection unit through the bus. A voltage Vbus is applied to the detection unit, a first test channel to the Nth test channel are sequentially opened,a current Im on the bus is measured, and whether a mth test channel is normal is judged according to the Im. By using the detection structure and method of the ATE system, a position of the test channel with a fault can be accurately positioned, and a reason why the test channel has the fault can be quickly judged.

Description

technical field [0001] The invention relates to ATE system detection, in particular to an ATE system detection structure and method. Background technique [0002] In the ATE (Automatic Test Equipment) system, there are a large number of test channel resources of the OD (opendrain) gate structure on the test resource board to detect or control the unit under test on the load board. as attached figure 1 As shown, the ATE system includes a test resource board and a PB board / load board, wherein the test resource board includes a controller and n test channels connected to the controller, the load board includes a unit under test, and the n test channels are The cable is connected to the unit under test. [0003] In reality, due to the defect of the device itself or the damage introduced during the production and assembly process, one or more test channels may fail. Therefore, before the test product is officially shipped, it is necessary to perform failure diagnosis of the te...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01R31/52G01R31/54
CPCG01R31/00
Inventor 陶祥袁栋
Owner SHANGHAI NCATEST TECH CO LTD
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