Detection structure and method of ATE system
A detection method and technology of detection structure, which are applied in the direction of measuring electricity, measuring device, short-circuit test, etc., can solve the problems of inability to accurately locate the location of the fault channel, high design cost, low efficiency, etc., and achieve automatic testing, low hardware cost, The effect of saving pin resources
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[0041] as attached Figure 5 As shown, the opening and closing of the test channel is controlled by the OD gate, and the OD gate is an NMOSFET tube, where Q 1 to Q n On behalf of the switch, when the control signal sent by the controller is high, the corresponding Q m conduction, so that the test channel is opened; when the control signal sent by the controller is low, the corresponding Q m Turn off, the test channel outputs high impedance, which makes the test channel turn off.
[0042] Measure the bus current I by using the pressurized current measurement function of the PE chip in the ATE system on the load board bus The change of the test channel can be judged whether it is normal or not. If the voltage applied by PE to the bus is V bus , resistor R 1 =…=R n =R. Under normal circumstances, the corresponding current change after a single channel is turned on: ΔI=V bus / R controls R and V bus The size of ΔI makes the ΔI skill meet the flow capacity required by the ...
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