3results about How to "Save pin resources" patented technology

The utility model relates to the technical field of temperature and humidity monitoring, and discloses a temperature and humidity conversion unibus circuit, which comprises a temperature and humidity sensor chip U1, a 1-Wire bus interface chip U2, a 100nF filter capacitor C1, a 2uF filter capacitor C2 and a Schottky diode D1, the IO pin 1 of the 1-Wire bus interface chip U2 is connected with a DQ line, the DQ line is a data signal line connected with a bus, and the IO pin 2 of the 1-Wire bus interface chip U2 is connected with the Schottky diode D1. And the anode of the Schottky diode D1 is connected with a DQ line, the cathode of the Schottky diode D1 is connected with VDD, and the Schottky diode D1 is used for providing reverse voltage protection for a pin IO of the 1-Wire bus interface chip U2. According to the technical scheme of the utility model, DS28EA00U + Tamp is adopted. The R1-Wire bus interface chip U2 and the IC bus of the SHT30-DIS-B temperature and humidity sensor chip U1 are multiplexed, a set of communication line does not need to be independently arranged for each chip, and the design of a power supply loop is simplified.

The application provides a multi-spi flash redundancy booting firmware method, and specifically as follows: an SPI bus on an MCU is connected in parallel with multiple SPI FLASHes, and then a GPIO pin of the MCU is used as CS0 and CS1 to be connected to CS pins of the SPI FLASHes respectively; an SPI FLASH to be measured is selected, and then an Xth data block in the SPI FLASH to be measured and a CRC check code of the Xth data block are read; a CRC check code corresponding to the read Xth data block is calculated, and is compared with the CRC check code stored in the SPI FLASH to be measured; if the CRC check code corresponding to the read Xth data block is equal to the CRC check code stored in the SPI FLASH to be measured, it is indicated that the check is passed, and the data is correct; if the CRC check code corresponding to the read Xth data block is not equal to the CRC check code stored in the SPI FLASH to be measured, it is indicated that the data is incorrect, and the next SPI FLASH needs to be continuously read, and the detection is sequentially performed. The application improves the reliability of the system, and is beneficial to long-time stable operation of the equipment.

This disclosure provides a chip testing apparatus, a chip testing system, and a chip testing method. The chip testing apparatus includes: a chip under test (TBT) with multiple input / output pins, wherein the input / output pins output test output signals during the testing process of the TTB; and a logic operation circuit for performing logical operations on the multiple test output signals output from the multiple input / output pins to obtain the test result of the TTB, and outputting the test result through a unified output pin. This chip testing apparatus eliminates the need for multiple test output pins, allowing for the output of a unified test result from a single pin. This reduces the pin resources required for the test output pins, thus saving pin resources associated with the test result of the TTB and improving resource utilization.