Fault wave recording method and system as well as terminal equipment

A technology of fault recording and wave recording, which is applied in the field of data processing, can solve the problems of useless data occupying storage space and communication bandwidth, waste of storage space and communication resources, etc., and achieve the effect of reducing storage space and communication bandwidth, and reducing the amount of data

Inactive Publication Date: 2020-01-31
厦门科华数能科技有限公司
View PDF8 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In view of this, the embodiment of the present invention provides a fault recording method, system, and terminal equipment to solve the problem of waste of storage space and communication resources in the prior art due to useless data occupying a large amount of storage space and communication bandwidth. question

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Fault wave recording method and system as well as terminal equipment
  • Fault wave recording method and system as well as terminal equipment
  • Fault wave recording method and system as well as terminal equipment

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.

[0028] In order to illustrate the technical solutions of the present invention, specific examples are used below to illustrate.

[0029] figure 1 It is a schematic diagram of the implementation flow of the fault recording method provided by an embodiment of the present invention. For the convenience of description, only the parts related to the embodiment of the present invention ar...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention is suitable for the technical field of data processing, and discloses a fault wave recording method and system as well as terminal equipment. The fault wave recording method comprises the following steps: starting timing from the moment when fault wave recording is triggered, and acquiring waveform data of a plurality of waveforms stored in a first storage after preset time, whereinthe preset time is shorter than the recording duration of the waveform data; partitioning the waveform data of a first waveform into a plurality of segments of preset waveform data according to a preset period, and selecting standard waveform data of the first waveform from the plurality of segments of waveform data; calculating the standard differences between other segments of preset waveform data of the first waveform and the standard waveform data of the first waveform respectively, and determining whether the first waveform is an abnormal waveform or not according to the standard difference and a preset standard difference threshold; and if the first waveform is determined to be the abnormal waveform, storing the waveform data of the first waveform in a second storage, and transmitting the waveform data to an analysis terminal. Through the adoption of the fault wave recording method and system, the amount of data stored and uploaded during communication can be reduced, and the occupied storage space and communication bandwidth are reduced.

Description

technical field [0001] The invention belongs to the technical field of data processing, and in particular relates to a fault wave recording method, system and terminal equipment. Background technique [0002] Fault recording means that when a fault occurs, the signal changes in the process of the fault are recorded, and the fault can be diagnosed by analyzing these signals. [0003] At present, fault recording usually records the waveform data of multiple sampling points that are prone to faults at the same time, stores the recorded waveform data and communicates and reports them. However, the above-mentioned waveform data may include both the waveform data recorded at the sampling point where the failure occurred and the waveform data recorded at the sampling point where no failure occurred, but the waveform data recorded at the sampling point where no failure occurred is useless for failure analysis However, such useless data occupies a large amount of storage space and c...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/08G01R13/00
CPCG01R31/08G01R13/00
Inventor 黄凯伦魏闻张惠珍马俊
Owner 厦门科华数能科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap