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Advanced Reference Detectors for Infrared Spectroscopy

A technology of infrared detector and spectrometry, which is applied in the field of reference detectors and can solve problems such as expensive

Active Publication Date: 2022-04-15
热电科学仪器有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Sweep gases can be used to reduce water vapor errors in the data; however, using such purge gases can be expensive

Method used

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  • Advanced Reference Detectors for Infrared Spectroscopy
  • Advanced Reference Detectors for Infrared Spectroscopy
  • Advanced Reference Detectors for Infrared Spectroscopy

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Embodiment Construction

[0020] Example embodiments of the claimed invention are described in detail below with reference to the accompanying drawings. Such descriptions are intended to be illustrative and not to limit the scope of the invention. Such embodiments are described in sufficient detail to enable those skilled in the art to practice the invention, and it is to be understood that other embodiments may be practiced with some modification without departing from the spirit or scope of the invention.

[0021] As discussed in more detail below, the present disclosure provides an FTIR spectrometry system with an advanced reference detector via which an IR reference signal is provided that is significantly stronger (eg, 50 to 150 times) than that of a conventional system , and since no light is taken from the main IR signal to feed the reference detector, the IR signal in the sample chamber is increased (eg 2 to 5%). This can be achieved by using previously unused light that has not passed through...

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Abstract

A spectrometry system and method in which an optical path follows an interferometer includes a Jacquinot diaphragm (70) having an aperture disposed substantially at its focal point. The Jacquinot stop includes a reflective surface (74) generally non-orthogonal to the longitudinal axis of the path and facing a source of IR signals containing an interferogram. The aperture (72) passes the inner portion of the incident IR signal while the reflective surface reflects the outer portion. The reflected outer portion of the incident IR signal that contains erroneous spectral information due to inherent imperfections in the interferometer optics is thus effectively removed from the initial incident IR signal that is ultimately used to illuminate the sample, but can still be used for Monitor the background spectrum of the sampling optics.

Description

[0001] Cross References to Related Applications [0002] This application claims priority to U.S. Provisional Application No. 62 / 532,513, filed July 14, 2017, and entitled "ADVANCED REFERENCE DETECTOR FOR INFRARED SPECTROSCOPY," which is published in its entirety Incorporated herein by reference. technical field [0003] The present invention relates to detectors for use in infrared spectroscopy, and in particular embodiments to reference detectors for use in Fourier Transform Infrared (FTIR) spectroscopy systems for monitoring background spectra. Background technique [0004] Fourier Transform Infrared (FTIR) spectroscopy was developed to address the limitations of dispersive spectroscopy techniques, especially the slow scanning process. Using FTIR, all infrared (IR) frequencies can be measured simultaneously rather than individually with a simple optical device called an interferometer. The interferometer produces a unique signal that contains all IR frequencies "encode...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/28G01J3/02G01J3/45
CPCG01J3/021G01J3/28G01J2003/2869G01J3/0229G01J3/45G01J3/0208G01J3/108G01J3/26G01N21/3504G01N21/3577G01N2021/3595
Inventor J·M·考菲
Owner 热电科学仪器有限公司