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Method for manufacturing and using horizontal electrode configuration structure of nanoscale phase change memory unit

A technology of phase-change memory and configuration structure, which is applied in the field of microelectronics, and can solve the problems such as small reading current cannot be read correctly, too small reading current, large amorphous phase resistance, etc., so as to facilitate correct reading and reduce Effect of increasing threshold current and read current

Active Publication Date: 2021-06-18
HUAZHONG UNIV OF SCI & TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Especially below the 10nm scale, the resistance of the amorphous phase becomes very large, resulting in too small a read current to read correctly, and a larger current is required to read
[0005] Therefore, it is necessary to propose a method for manufacturing a new electrode configuration structure suitable for nanoscale phase change units to solve the problem of too small read current and power consumption in the process of high-resistance amorphization at the nanoscale

Method used

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  • Method for manufacturing and using horizontal electrode configuration structure of nanoscale phase change memory unit
  • Method for manufacturing and using horizontal electrode configuration structure of nanoscale phase change memory unit
  • Method for manufacturing and using horizontal electrode configuration structure of nanoscale phase change memory unit

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Embodiment Construction

[0031] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other. The present invention will be further described in detail below in combination with specific embodiments.

[0032] As a preferred embodiment of the present invention, such as figure 1 As shown, the present invention provides a horizontal electrode configuration structure for nanoscale phase change memory cells, wherein:

[0033] The horizontal electrode configuration structure 100 includes an up...

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Abstract

The invention discloses a method for manufacturing and using a horizontal electrode configuration structure for a nanoscale phase-change memory unit. The lower phase-change material layer and the upper electrode material layer are grown sequentially according to the procedures; during processing, the upper electrode material layer is based on the same process. The photolithography process forms the upper electrode of the outer ring common drain ground and the upper electrode of the inner source end; when in use, the upper layer electrode of the inner source end is connected to the source end, and the upper layer electrode of the outer ring common drain ground is common drain ground, and the source and drain end cannot be exchanged, and the current flows from The equipotential surface of the upper layer electrode at the inner source end flows horizontally to the outer ring equipotential surface of the outer ring common drain grounding upper layer electrode. For the high-resistance amorphous state, compared with the square structure, the equivalent resistance value R is significantly reduced, and the read current is increased, which is convenient for correct reading. Moreover, the horizontal flow of current reduces the current loss of elements connected in series at both ends in a general sense, thereby reducing the threshold current required for the amorphization process and reducing the overall power consumption.

Description

technical field [0001] The invention belongs to the field of microelectronics, and relates to a method for manufacturing and using a horizontal electrode configuration structure for a nanoscale phase change memory unit, in particular to the design and manufacture of a phase change memory element based on a chalcogenide phase change material method and its application. Background technique [0002] The phase change memory based on the chalcogenide phase change material can store information and data through the huge resistance difference between the crystalline phase and the amorphous phase, and can even achieve multi-level phase change storage. This phase-change process has the advantages of low power consumption and high-density cost as the size decreases, so the industry pays great attention to the development of nanoscale phase-change memory. [0003] At present, there are relatively mature applications in the structural design of phase change units, such as T-shaped str...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L45/00
CPCH10N70/231H10N70/841H10N70/011
Inventor 童浩马平缪向水
Owner HUAZHONG UNIV OF SCI & TECH
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