Method for fitting path points by improved cubic spline interpolation curves
A spline interpolation and curve fitting technology, which is applied to road network navigators, measuring devices, instruments, etc., can solve the problems that the maximum steering angle constraint cannot be guaranteed, angle information is not included, and the calculation amount of way point insertion is large.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0048] The present invention will be described in further detail below in conjunction with the embodiments given in the accompanying drawings.
[0049] refer to figure 1 As shown, the present invention is applied to the sparse path point P obtained by the fitting graph search algorithm i =(x i ,y i , θ i ), each path point contains the vehicle coordinate information and the yaw angle information of the vehicle at the path point, and the curve between two adjacent path points is obtained by using the cubic spline interpolation curve fitting method between two adjacent path points Express the formula, so that high-density continuous interpolation path points can be obtained through equidistant distance dispersion.
[0050] Such as figure 2 As shown, when the traditional cubic spline interpolation curve fitting method is used to fit each path point, when two path points are too close in the direction of the horizontal axis or the vertical axis, the fitted cubic sample Arbi...
PUM

Abstract
Description
Claims
Application Information

- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com