GIS equipment defect simulation analysis device and method
A technology of equipment simulation and simulation analysis, applied in the direction of instruments, testing dielectric strength, measuring devices, etc., can solve problems such as unstable performance of GIS equipment, and achieve the effects of widespread use, accurate and reliable data, and improved accuracy
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[0044] When doing simulation analysis on GIS equipment, the main concern is the electrical defects of GIS equipment. The applicant found that in practical applications, the GIS equipment does not only fail to work normally due to electrical defects, such as mechanical failures caused by loose components or aging, which also affect the normal use of the GIS equipment. For this reason, the present application provides a technical solution capable of performing analog detection on both electrical defects and mechanical defects. The following will describe in detail with specific embodiments.
[0045] In order to enable those skilled in the art to better understand the solution of the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. Apparently, the described embodiments are only some of the embodiments of the present invention, but not all of them. Based on the embodiments o...
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