Unlock instant, AI-driven research and patent intelligence for your innovation.

Virtual machine memory access feature extraction method and system on Shenwei architecture

A feature extraction and virtual machine technology, which is applied in memory systems, software simulation/interpretation/simulation, instruments, etc., can solve the problems of resource utilization such as memory being less than 40%, insufficient memory, etc.

Active Publication Date: 2020-03-06
PEKING UNIV
View PDF6 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

According to the survey, the utilization rate of memory and other resources of well-known cloud computing platform suppliers at home and abroad is less than 40%.
Some virtual machines tend to have more free memory than used memory over a period of time, while other virtual machines may run out of memory

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Virtual machine memory access feature extraction method and system on Shenwei architecture
  • Virtual machine memory access feature extraction method and system on Shenwei architecture
  • Virtual machine memory access feature extraction method and system on Shenwei architecture

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] In order to make the objectives, technical solutions, and advantages of the present invention clearer, the present invention will be further elaborated below through specific embodiments and drawings. It should be understood that the specific embodiments described here are only used to explain the present invention, but not to limit the present invention.

[0033] The invention discloses a method for extracting memory access features of a virtual machine on the Shenwei architecture. The realization principle of the whole mechanism of this method is as follows figure 1 . The memory access feature extraction method can be specifically divided into three parts: "set-interrupt" method, "memory access failure rate curve" construction method, and "hot page set" mechanism.

[0034] 1. "Set-Interrupt" method

[0035] In order to calculate the working set size, the system needs to obtain the fetch sequence of the virtual machine application. In a virtualized environment, due to the e...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a virtual machine memory access feature extraction method and system on Shenwei architecture. The virtual machine memory access feature extraction method comprises the steps: obtaining the reuse distance distribution, memory page missing rate and memory access page missing rate curve of a virtual machine memory access sequence through a hot page set mechanism, a setting-interruption method and a memory access failure rate curve construction method, and obtaining the size of a virtual machine work set. According to the virtual machine memory access feature extraction method, a dynamic memory access feature extraction technology is realized on the Shenwei platform for the first time, and a high-precision memory missing rate curve is successfully drawn, and an accurateworking set size is calculated, and a basic condition is provided for carrying out effective multi-virtual-machine memory dynamic allocation according to the working set size in the next step to improve the memory utilization rate.

Description

Technical field [0001] The invention relates to the field of server memory virtualization optimization, in particular to a method and system for extracting memory access features of virtual machines on Shenwei architecture. [0002] technical background [0003] As one of the representatives of domestic CPU, Shenwei architecture CPU is already a relatively mature solution. Shenwei servers have been applied to many domestic applications, especially key areas of the Chinese government and related organizations. As a domestically produced CPU architecture with completely independent property rights, Shenwei is developed and managed under the control of the country, so it can ensure the safety of the system well and is suitable for a variety of computer applications. Shenwei architecture servers will participate in more high-credibility and high-security fields in the future, such as cloud data storage, large-scale data processing, and cloud computing. However, compared with traditio...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F9/455G06F11/30G06F11/32G06F11/34G06F12/1027G06F12/123
CPCG06F9/45558G06F11/3037G06F11/301G06F11/3065G06F11/323G06F11/3476G06F12/1027G06F12/123G06F2009/45583G06F2201/815
Inventor 沙赛汪小林罗英伟
Owner PEKING UNIV
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com