Fabric defect detection method and device
A detection method and defect technology, applied in measurement devices, neural learning methods, biological neural network models, etc., can solve the problems of low reliability of detection results and low calculation efficiency of detection algorithms, improve generalization ability, and save parameters. , to prevent the effect of overfitting
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0073] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative efforts fall within the protection scope of the present invention.
[0074] Embodiments of the present invention provide a fabric defect detection method, such as figure 1 shown, including:
[0075] Step S10, obtaining a ResNet50 model.
[0076] In this embodiment, the ResNet50 model trained on the ImageNet dataset is downloaded through network resources.
[0077] Step S20, replacing the first classifier of the ResNet50 mod...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com