Detection of Alignment Loss in Optical Imaging Modules
An optical image and detector technology, applied in photovoltaic modules, testing optical performance, optics, etc., can solve problems such as offset
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[0049] Figure 5 is a schematic cross-sectional view of an optoelectronic device 55 according to another embodiment of the present invention. In this and subsequent embodiments, the beam from the VCSEL 12 is internally reflected four or more times within the microprism lens, thereby increasing the optical path length and thus the diameter of the beam projected out of the device.
[0050] Optoelectronic device 55 includes the following items similar to those of device 21 and are labeled with the same references: planar semiconductor substrate 10 , VCSEL 12 and gold layer 16 . As in device 21 , VCSEL 12 emits light beam 14 in a vertical direction relative to substrate 10 . Microprism lenses 60 are formed over the VCSEL 12 . As in device 21 , microprismatic lens 60 comprises a material that is transparent at the wavelength of light beam 14 .
[0051] The first section 62 of the surface 64 of the microprismatic lens 60 includes a first subsection 62a and a second subsection 62b...
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