Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Tight coupling miniaturized metamaterial structure

A metamaterial, tightly coupled technology, applied in the microwave field, can solve the problems of large distributed capacitance, limited miniaturization, complex process, etc., and achieve the effect of reducing the overall size of the structure, realizing miniaturization, and simple process

Active Publication Date: 2020-04-03
武汉灵动时代智能技术股份有限公司
View PDF6 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method exists: 1. The degree of miniaturization is limited (because the smallest lumped device specification is 0201, the length is 0.6mm, and the width is 0.3mm, so the gap size of the distributed capacitor cannot be less than 0.5mm, but the actual PCB processing technology can be Make the gap 0.05mm, the smaller the gap between the equivalent capacitance structures, the larger the distributed capacitance); 2. The process is complex; 3. The higher the degree of miniaturization, the larger the loaded lumped capacitance, resulting in grating lobes also bigger

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Tight coupling miniaturized metamaterial structure
  • Tight coupling miniaturized metamaterial structure
  • Tight coupling miniaturized metamaterial structure

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0020] see figure 1 , and combined with figure 2 and image 3 As shown, a tightly coupled miniaturized metamaterial structure of the present invention includes a dielectric substrate 10, wherein a printed metal layer 11 is provided on one end surface of the dielectric substrate 10, and a cross-shaped metal layer 11 is provided on the other end surface of the dielectric substrate 10. Shaped metal frame 20 , and a coupling capacitor layer 12 is embedded in the dielectric substrate 10 .

[0021] Wherein, the area of ​​the printed metal layer 11 is smaller than the area of ​​the dielectric substrate 10, and the coupling capacitance layer 12 is arranged on the side of the d...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A compact coupling miniaturized metamaterial structure provided by the invention comprises a dielectric substrate, a printed metal layer is arranged on the end face of one side of the dielectric substrate, a cross-shaped metal frame is arranged on the end face of the other side of the dielectric substrate, and a coupling capacitor layer is further arranged in the dielectric substrate in an embedded mode. According to the compact coupling miniaturized metamaterial structure, the inductance structure is formed by utilizing the metal frame with the cross-shaped structure, and a capacitor structure connected in parallel is formed by utilizing the interaction between the embedded coupling capacitor layer in the dielectric substrate and the printing metal layer, so that the larger equivalent capacitance is generated, the structural size of the metamaterial is reduced, and the miniaturization of the metamaterial is realized.

Description

technical field [0001] The invention relates to the field of microwaves, and more specifically, relates to a tightly coupled miniaturized metamaterial structure. Background technique [0002] The wide coverage of radar and various wireless devices has resulted in a tight use of spectrum resources. Multi-frequency communication and multi-frequency radar have become the direction of rapid development in the modern microwave field, followed by mutual interference between devices in different frequency bands. Because the metamaterial structure can frequency-select and filter electromagnetic waves in space and shield out-of-band signals, the study of metamaterial structures is of great significance. [0003] The metamaterial structure can filter electromagnetic waves in space, and exhibits obvious band-pass or band-resistance characteristics when interacting with electromagnetic waves. It is a two-dimensional periodic array structure composed of periodically arranged metal patche...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01Q15/00
CPCH01Q15/0026
Inventor 张岭陈志勇
Owner 武汉灵动时代智能技术股份有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products