Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Femtosecond pulse measuring method and device

A technology of femtosecond pulse and measurement method, which is applied in the direction of instruments, etc., can solve the problem of low frequency resolution, and achieve the effect of wide experimental conditions and wide practicability

Active Publication Date: 2020-04-14
HUAZHONG UNIV OF SCI & TECH
View PDF4 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Aiming at the defects of the prior art, the purpose of the present invention is to solve the technical problem of low frequency resolution of the existing method for detecting femtosecond pulses

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Femtosecond pulse measuring method and device
  • Femtosecond pulse measuring method and device
  • Femtosecond pulse measuring method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0040] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.

[0041] In view of the defects of the existing sampling measurement method for measuring femtosecond pulse technology, the purpose of the present invention is to provide a method for measuring femtosecond pulse with higher frequency resolution. Pulse measurement.

[0042] The present invention provides a technical solution for measuring femtosecond pulses of arbitrary polarization, the specific st...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
strengthaaaaaaaaaa
Login to View More

Abstract

The invention discloses a femtosecond pulse measuring method and device. The femtosecond pulse measuring method comprises the steps that higher harmonics of two channels are generated through interaction of a pulse laser driving field and rare gas; higher harmonics of the two channels interfere with each other; a femtosecond pulse to be measured is introduced into the process of interaction between the pulse laser and the rare gas so as to change the accumulated phases of the generated higher harmonics of the two channels, so that the higher harmonics of each channel generate energy drift; through energy drift information generated by higher harmonics of the two channels respectively, a function that the higher harmonic energy drift of each channel changes along with time delay is determined, and structure information of a first component of the femtosecond pulse to be measured is determined according to the function; and the first component is the component with the same polarizationdirection of the femtosecond pulse to be measured and the pulse laser driving field. According to the method, the frequency drift amount of higher harmonic spectrum perturbation along with time delayis extracted, and the femtosecond pulse is reconstructed from the drift amount changing along with time delay.

Description

technical field [0001] The present invention relates to the field of ultrafast laser technology, and more specifically, to a method and device for measuring femtosecond pulses. Background technique [0002] Due to its extremely high time resolution, femtosecond pulses have always been an important means of probing microphysics, so the complete measurement of the time structure of femtosecond pulses is very important. Generally speaking, the current measurement methods for femtosecond pulses are generally divided into two categories: (1) coherent measurement methods, the most commonly used ones, such as: self-coherent measurement (FROG), spectral shearing interferometry (SPIDER), etc., have been It can well meet various femtosecond pulse measurement requirements, but because these methods reconstruct the pulse in the frequency domain, the femtosecond pulse to be measured cannot be obtained intuitively in real time. (2) Sampling measurement method, which uses attosecond pulse...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01J11/00
CPCG01J11/00
Inventor 曹伟杨震徐会姚弥康莫云龙张庆斌陆培祥
Owner HUAZHONG UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products