Method for finely complementing defect optical flow graph and application thereof
An optical flow graph and fine technology, applied in the field of image processing and deep learning, can solve the problems of optical flow graph defects, slow processing speed, and large amount of processed data, so as to improve operating efficiency, improve stability, and reduce data processing volume effect
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Embodiment 1
[0081] A method for finely complementing a defect optical flow map, the steps of which are as follows Figure 4 As shown, specifically:
[0082] (1) Collect the smoke picture I in real time, process the smoke picture I to obtain the optical flow image, detect and locate the dynamic occlusion area of the smoke, specifically:
[0083] (1.1) After real-time collection of smoke picture I, it is preprocessed. Preprocessing refers to the construction of smoke information data with label information to mark out the smoke area in smoke picture I, wherein the picture resolution of smoke picture I is greater than or equal to 1920 ×1080 pixels;
[0084] (1.2) Taking the preprocessed smoke picture I as input, input the trained LiteFlowNet to obtain the optical flow image of the smoke picture I, wherein, the input of LiteFlowNet is two adjacent frames in the preprocessed smoke picture I, and the output is Optical flow images corresponding to two adjacent frames;
[0085] LiteFlowNet h...
Embodiment 2
[0126] an electronic device such as Figure 5 As shown, including one or more processors, one or more memories, one or more programs and image acquisition devices;
[0127] The image acquisition device is used to collect the smoke picture I in real time, and one or more programs are stored in the memory, and when the one or more programs are executed by the processor, the electronic device performs the same kind of defect detection as in embodiment 1. A method for finely completing optical flow graphs.
[0128] It has been verified that the electronic device of the present invention has a simple structure and low cost, can finely complement a defect optical flow map, and has a good application prospect.
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