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DDR chip test method, device and equipment and computer readable storage medium

A technology of chip testing and computer programs, applied in static memory, instruments, etc., can solve problems such as low product yield, achieve the effects of improving production efficiency, preventing missed testing, and saving manpower

Inactive Publication Date: 2020-05-29
BIWIN STORAGE TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The main purpose of the present invention is to propose a DDR chip testing method, aiming to solve the technical problem of low product yield due to manual detection of DDR chips

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  • DDR chip test method, device and equipment and computer readable storage medium
  • DDR chip test method, device and equipment and computer readable storage medium
  • DDR chip test method, device and equipment and computer readable storage medium

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Embodiment Construction

[0050] Embodiments of the present invention will be described in detail below, examples of which are shown in the drawings, wherein like reference numerals designate like elements or elements having the same function throughout. The embodiments described below by referring to the accompanying drawings are exemplary and are intended to explain the present invention, but cannot be construed as limitations to the present invention. Based on the embodiments in the present invention, those of ordinary skill in the art have no creative work All other embodiments obtained under the premise all belong to the protection scope of the present invention.

[0051] Such as figure 1 As shown, the present invention proposes a kind of DDR chip testing method, in one embodiment, this DDR chip testing method comprises:

[0052] Step S10 : When the start-up test command is detected, send the test command to the target test terminal in the start-up test command, so that the target test terminal i...

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Abstract

The invention discloses a DDR chip testing method, device and equipment and a computer readable storage medium. The DDR chip test method comprises the following steps: sending a test instruction to atarget test terminal in a start test instruction under the condition that the start test instruction is detected, so that the target test terminal executes power-on and test operations according to the test instruction; acquiring a feedback signal of the target test terminal within a specified time, and determining a test result according to the feedback signal of the target test terminal; and sending a test result according to a preset communication protocol, wherein the test result is used for indicating the abnormal condition of the DDR chip. According to the DDR chip testing method, the problem that the chip yield is affected due to missing testing and screening errors can be prevented, manpower can be saved due to full-automatic operation, and the production efficiency is improved.

Description

technical field [0001] The invention relates to the technical field of chip testing, in particular to a DDR chip testing method, device, equipment and computer-readable storage medium. Background technique [0002] DDR (Double Data Rate, double-rate synchronous dynamic random access memory) chip is a high-bandwidth parallel data bus used in the field of computers and electronic products. The standard DDR test is mainly divided into three aspects, namely: function test, timing parameter test, electrical performance test. [0003] The commonly used test method is generally that the operator manually installs the DDR chip into the mobile phone, and then operates the test equipment to perform power-on and function tests on the DDR chip in each mobile phone in turn. After completing the test of a chip, the operator will test it. The results are recorded, and the qualified and unqualified DDR chips are manually distinguished at the next station to screen out the qualified DDR chi...

Claims

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Application Information

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IPC IPC(8): G11C29/08G11C29/56
CPCG11C29/08G11C29/56
Inventor 刘冲李振华
Owner BIWIN STORAGE TECH CO LTD