Automatic test system and test method for realizing hot plug function of SIM cards

An automated testing and hot-swapping technology, which is applied in the direction of testing sensing devices, instruments, and inductive recording carriers, can solve problems affecting production efficiency and problems with SIM card hot-swapping functions, saving time and improving testing efficiency and production efficiency, the effect of reducing the production cycle

Pending Publication Date: 2017-09-15
SHENZHEN TECNO TECH CO LTD
View PDF2 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0011] It is not difficult to see that if the test method in the prior art is used to test the SIM card hot-swappable function, it is necessary to wait until the complete assembly of the smart mobile terminal to have a chance to find that there is a problem with the SIM card hot-swappable function. Handling and solving by disassembling the machine will undoubtedly greatly affect the production efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Automatic test system and test method for realizing hot plug function of SIM cards
  • Automatic test system and test method for realizing hot plug function of SIM cards
  • Automatic test system and test method for realizing hot plug function of SIM cards

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0062] The following combination Figure 2 ~ Figure 11 , detailing multiple preferred embodiments of the present invention.

[0063] Such as figure 2 As shown, the automatic test system for realizing the hot-swappable function of SIM card provided by the present invention is used for the automatic test stage in the whole production process of intelligent mobile terminals, including: main control module 1, which is arranged on a PC; SIM card empty The slot test module 2 is connected in communication with the main control module 1. In the PCBA (basic function debugging) stage, the main control module 1 controls whether the empty slot state of the SIM card slot is normal to test; the hot plug test module 4. Communicating with the main control module 1, the main control module 1 controls whether the hot-swapping function of the SIM card inserted into the slot is normal during the PCBA ATA stage and the factory whole machine test stage respectively.

[0064] Further, the describ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to an automatic test system and a test method for realizing the hot plug function of SIM cards, which are used in the automatic test process of intelligent mobile terminals. The method comprises a basic function debugging phase (S1), an automatic test phase by research and development personnel (S2), and a factory whole-machine test phase (S3). In the basic function debugging phase, an SIM card empty slot test module tests whether an SIM card slot is empty, and if there is abnormality, the SIM card slot is maintained, and the method returns to S1. In the automatic test phase by research and development personnel, a hot plug test module tests the hot plug function of an SIM card inserted into the slot, and if there is abnormality, the SIM card slot is maintained, and the method returns to S2. In the factory whole-machine test phase, the hot plug test module tests the hot plug function of an SIM card inserted into the slot, and if there is abnormality, an intelligent mobile terminal is disassembled, the SIM card slot is maintained, and the method returns to S3. The method ensures that intelligent mobile terminals will be intercepted in the research and development and debugging phase to find out abnormal slots without SIM cards and the abnormality in hot plug function of SIM cards, and SIM card slots can be maintained in time. Therefore, the test efficiency and production efficiency of factories are improved.

Description

technical field [0001] The invention relates to an automatic production test technology, specifically an automatic test system and a test method for realizing a SIM card hot-swapping function, which can detect the abnormality of the SIM card hot-swapping function in time during the production process. Background technique [0002] SIM (Subscriber Identification Module) card is a smart card with an IC (Integrated Circuit) chip, which is used to install in a smart mobile terminal (such as a mobile phone) for user identification and record user basic information , address book, communication information, etc. With the rapid development and wide application of mobile communication technology, many smart mobile terminal users currently hold multiple SIM cards in order to use different SIM cards for different types of contacts, or use different SIM cards in different regions , to realize the replacement and use of multiple SIM cards on the same smart mobile terminal. [0003] Th...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06K7/00
CPCG06K7/0008G06K7/0095
Inventor 贾四海牛建民
Owner SHENZHEN TECNO TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products