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Defect level judgment method and storage medium

A determination method and defect technology, applied in the field of image recognition, can solve the problems of variable defects and low accuracy, and achieve the effect of reducing detection time, reducing computing requirements, and saving configuration costs.

Pending Publication Date: 2020-06-02
富联裕展科技(河南)有限公司
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Problems solved by technology

However, the types of defects are very changeable, and there is no algorithm in the prior art that can cover all types of defects to accurately detect defects
Therefore, the existing image processing technology is not very accurate for this kind of changeable detection target.

Method used

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  • Defect level judgment method and storage medium
  • Defect level judgment method and storage medium
  • Defect level judgment method and storage medium

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Embodiment Construction

[0055] In order to more clearly understand the above objects, features and advantages of the present invention, the present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be noted that, in the case of no conflict, the embodiments of the present application and the features in the embodiments can be combined with each other.

[0056] In the following description, many specific details are set forth in order to fully understand the present invention, and the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0057] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understo...

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Abstract

The invention provides a defect level judging method. The defect level judging method comprises the following steps: acquiring at least one image of a to-be-detected object; extracting a target defectarea from the image; acquiring a first characteristic parameter of the target defect area; obtaining a weighted value according to the first characteristic parameter and a preset rule; acquiring a second characteristic parameter of the target defect area; calculating a defect specification score according to the second characteristic parameter and the weighted value; judging a defect level corresponding to the target defect area according to the defect specification score; and outputting the defect level. The invention further provides a computer readable storage medium. According to the method, the accuracy and efficiency of defect grade judgment can be improved.

Description

technical field [0001] The invention relates to the technical field of image recognition, in particular to a method for judging a defect level and a storage medium. Background technique [0002] The current product manufacturing industry is developing in the direction of high precision and high quality. During the processing of precision metal parts, various defects such as bumps, crushes, and abrasions are prone to occur, and the size of the defects reaches the micron level. Therefore, product testing is more important and difficult. In order to meet the requirements of appearance quality, automated optical inspection (Automated Optical Inspection, AOI) equipment needs to accurately classify and grade detected defects. [0003] For the classification of defects, due to the randomness of the types of defects and the limitations of AOI, the traditional defect classification method uses the machine vision appearance defect detection method. However, the types of defects are...

Claims

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Application Information

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IPC IPC(8): G06T7/00G06T7/62
CPCG06T7/0006G06T7/62G06T2207/10004G06T2207/30164G06T2207/20081G06T2207/20084
Inventor 赵学兴元海燕韩笑笑田登奎
Owner 富联裕展科技(河南)有限公司
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