Universal aging jig and aging equipment

Abstract

The invention discloses a universal aging jig and aging equipment. The aging jig comprises a fixed pedestal, a connecting assembly disposed on the fixed pedestal, and two double-layer guide rails which are oppositely disposed on the fixed pedestal, and the tail ends of the double-layer guide rails are opposite to the connecting assembly. Each double-layer guide rail comprises a first guide rail single body arranged on the fixed pedestal and a second guide rail single body arranged on the first guide rail single body. The two oppositely-arranged first guide rail single bodies form a first guiderail assembly. The two second guide rail single bodies which are oppositely arranged form a second guide rail assembly. Bearing pairs for guiding are arranged on the opposite side faces of the firstguide rail single bodies and the second guide rail single bodies. A Mono connector and an eMMC connector are arranged on the connecting assembly. The first guide rail assembly and the second guide rail assembly are used for loading and guiding in a Mono burn-in board or an eMMC burn-in board, so that the Mono burn-in board is connected with the Mono connector, or the eMMC burn-in board is connected with the eMMC connector. According to the scheme, the applicability of the aging test equipment is improved, and the aging test cost is reduced.

Description

technical field [0001] The invention relates to the field of semiconductor testing, more specifically to a general aging fixture and aging equipment. Background technique [0002] In the existing semiconductor storage manufacturing field, aging equipment performs aging on IC storage products. The burn-in equipment provides the temperature cycle environment required for burn-in, and establishes communication between the host computer test software and test products through hardware, so as to perform burn-in tests on IC products in the required temperature environment. Among them, the test aging fixture is an important part of the hardware composition. [0003] The burn-in fixture is installed in the burn-in equipment, and a connector interface is provided to enable the burn-in board to complete the test communication with the host computer of the burn-in equipment. Existing aging fixtures include aging fixtures adapted to MonoFlash products and aging fixtures adapted to eMM...

AI Technical Summary

Problems solved by technology

Existing aging fixtures include aging fixtures adapted to MonoFlash products and aging fixtures adapted to eMMC products. The aging fixture has a single function and is only suitable for specific objects, so it can only be satisfied with the above two products One of them does not have compatibility and versatility, and cannot make maximum use of the temperature cycle environment provided by aging equipment

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