A test method for the electromagnetic environment effect of the monitoring system under the environment of variable rising edge and wide pulse electric field

Abstract

The invention discloses a method for testing the electromagnetic environment effect of a monitoring system under a variable rising edge wide pulse electric field environment. The method utilizes steepening inductance, adjusting inductance, and a low-inductance short circuit in conjunction with a pulse steepening device to realize the rising edge of the radiation field from ns The level is continuously adjusted to the μs level; use the sensitivity self-calibration electric field probe, electric field data automatic acquisition and analysis software to solve the problem of simultaneous testing of the rising edge and pulse width of the electric field waveform; use the empty field linear calibration method to solve the test in different areas of the bounded wave simulator Field strength and rising edge calibration issues, and provide specific test methods and operating procedures for monitoring system environmental effects, which can ensure the standardization and rationality of monitoring system electromagnetic environmental effects testing in low-frequency wide pulse electric field environments, and can improve the monitoring system electromagnetic environmental effects The accuracy of the test.

Description

technical field [0001] The invention belongs to the field of test methods for electromagnetic environment effects of electronic systems, and in particular relates to a test method for electromagnetic environment effects of a monitoring system under a variable rising edge width pulse electric field environment. Background technique [0002] Utility model patent ZL201820312470.5 "A simulation device for fast rising edge wide pulse strong electric field environment" proposes a wide pulse strong electric field simulation device with adjustable rising edge, which can generate adjustable pulse rise within the range of 0-50ns Strong electric field waveform along the edge and millisecond pulse width. However, the simulation range of the rising edge of this device is too narrow, and the device still needs to be improved for low-frequency electric fields (rising edges of hundreds of ns to μs). In addition, there is a gap of several orders of magnitude between the rising edge and puls...

AI Technical Summary

Problems solved by technology

However, the simulation range of the rising edge of this device is too narrow, and the device needs to be improved for low-frequency electric fields (rising edges of hundreds of ns to μs)

In addition, there are several orders of magnitude gaps between the rising edge and pulse width of the waveform generated by this device. Considering the test capabilities of current general-purpose electric field probes and oscilloscopes, it is impossible to use a set of electric field probes and oscilloscopes to simultaneously achieve accurate testing of rising edges and pulse widths. In the actual use process, the waveform test and analysis method of the simulation device is an urgent problem to be solved

[0003] Invention patent ZL201510020231.3 "Experimental Method for Electromagnetic Environmental Effects of Electronic Equipment in a Bounded Wave Environment" standardizes the experimental methods and steps for the electromagnetic environmental effects of electronic equipment in a bounded wave electric field simulator, and divides different test areas for equipment, but the patent There is no regulation on how to test the field strength in different areas during the test: if the method of testing the field strength probe and equipment at the same time is adopted, the existence of the equipment will have a very large impact on the waveform of the field strength probe test field, resulting in inaccurate test data; If the field strength is directly converted according to different heights, the patent does not give specific operation methods and requirements

There are few research reports on the electromagnetic interference or damage of the monitoring system in the existing public literature, and the test requirements, methods and steps have not yet been specified

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