A Few-Sample Learning Method Based on Multi-scale Metric Learning
A technology of metric learning and learning method, applied in the field of image processing and recognition, can solve the problem of not being able to solve small sample learning tasks well, and achieve the effects of easy implementation and use, improved recognition accuracy, and reasonable design.
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[0031] The method of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments of the present invention.
[0032] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and examples.
[0033] It should be noted that the terminology used here is only for describing specific implementations, and is not intended to limit the exemplary implementations according to the present application. As used herein, unless the context clearly dictates otherwise, the singular is intended to include the plural, and it should also be understood that when the terms "comprising" and / or "comprising" are used in this specification, they mean There are features, steps, operations, means, components and / or combinations thereof....
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