A parallel test system for can bus controller

Abstract

The invention relates to a CAN bus controller parallel testing system, which belongs to the technical field of electronic component detection, and solves the problem that the existing CAN bus controller test cannot realize real working state consideration, debugging, and compiling and testing PATTERN, which are cumbersome and difficult. The system includes: a test machine, multiple CAN nodes, and channel control components; each CAN node includes a CAN bus controller and a CAN bus transceiver, and the CANL and CANH of multiple CAN bus transceivers are connected to form a CAN bus; The test machine configures multiple CAN bus controllers based on different test modes, and monitors their status to obtain test results; the configuration port of the CAN bus controller is connected to the digital channel of the test machine; the channel control components are controlled based on different test modes Switching between the first channel and the second channel; the TX and RX ports of the CAN bus controller in the first channel are connected to the CAN bus transceiver; the TX and RX ports of the CAN bus controller in the second channel are connected to the digital channel of the test machine connected.

Description

technical field [0001] The invention relates to the technical field of electronic component detection, in particular to a CAN bus controller parallel testing system. Background technique [0002] CAN bus controller is a controller device with powerful functions and many internal registers. Its testing has always been a difficult problem in the industry. Even if some organizations can complete the simple function test of sending and receiving messages, they cannot traverse the numerous resource modules and various internal registers. a processing mechanism. [0003] The test of a single-chip digital device generally directly connects the device pins to the digital channel, connects the power supply and ground of the device to the DPS and GND of the test system to supply power for the device, and there will be some auxiliary capacitors in the process of making the test interface board to filter. During the test process, the device input pins are generally read, written, and ...

AI Technical Summary

Problems solved by technology

[0006] However, in the existing test method, there is only the physical connection between the digital channel of the test machine and the CAN bus controller pins during the test, and there is no actual CAN bus, nor can the CAN bus transceiver and other nodes. During the process, the test machine should not only simulate the CPU to configure the registers of the bus controller, but also simulate the complete CAN environment (mainly simulate the "high and low levels" of the data sent back from the RX end), and each cycle should be combined with the CAN actual The bus environment is given

[0007] Therefore, the test method of the CAN bus controller in the prior art cannot consider its real working state on the one hand; on the other hand, the process of debugging and writing the test pattern is too cumbersome and difficult

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