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Input/output module test method, device and system and storage medium

An output module and test method technology, applied in the field of electronic information, can solve problems such as affecting test results, waste of manpower and time costs, and damage to input/output modules, so as to avoid waste of manpower and time costs, avoid damage, and improve testing. effect of effect

Pending Publication Date: 2020-09-29
SIEMENS FACTORY AUTOMATION ENG
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  • Abstract
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  • Claims
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Problems solved by technology

However, errors in manual operation will cause damage to the input / output modules, and will also cause waste of manpower and time costs during the test process, affecting test results

Method used

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  • Input/output module test method, device and system and storage medium
  • Input/output module test method, device and system and storage medium
  • Input/output module test method, device and system and storage medium

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Embodiment Construction

[0087] In order to enable those skilled in the art to better understand the technical solutions in the embodiments of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described The embodiments are only some of the embodiments of the present invention, but not all of them. All other embodiments obtained by persons of ordinary skill in the art based on the embodiments in the embodiments of the present invention shall fall within the protection scope of the embodiments of the present invention.

[0088] During the testing process of the input / output module, the type of the input / output module is manually judged, so that the corresponding module type is selected in the operation interface by manual operation, and then the start of the test plan is manually triggered. This manual judgme...

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Abstract

The embodiment of the invention provides an input / output module test method and device, electronic equipment and a computer storage medium. The input / output module test method comprises the steps of obtaining a result of scanning and identifying an identification area of at least one to-be-tested input / output module, wherein the result of scanning and identifying comprises module ordering number information of the to-be-tested input / output module; determining a test scheme corresponding to the type of the to-be-tested input / output module according to the module ordering number information of the to-be-tested input / output module; and when the to-be-tested input / output module is in the test connection state, automatically starting the test performed on the to-be-tested input / output module according to the corresponding test scheme. According to the scheme, a user does not need to manually judge the type of the to-be-tested input / output module, manually select the corresponding module type and manually trigger the starting of the test scheme, so that the damage of the input / output module caused by manual operation errors is avoided, and the test effect is improved.

Description

technical field [0001] The invention relates to the technical field of electronic information, in particular to an input / output module testing method, device, system and storage medium. Background technique [0002] The input / output (I / O) module test is a test for different types of input / output modules. During the test process, it is necessary to select a test plan for different types of input / output modules. According to the selected test plan test. [0003] Usually, the test schemes of different types of input / output modules are selected manually, such as manually judging the type of the input / output module to be tested, and selecting the corresponding module type in the operation interface through manual operation, and manually triggering the test scheme. start up. However, errors in manual operation will cause damage to the input / output module, and will also cause waste of manpower and time costs during the test process, which will affect the test effect. Contents o...

Claims

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Application Information

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IPC IPC(8): G06F11/36
CPCG06F11/3688G06F11/3684
Inventor 朱振华董庆亮
Owner SIEMENS FACTORY AUTOMATION ENG
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