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Signal recovery method in the presence of incoherent sampling and harmonic distortion in adc spectrum testing

A signal recovery, non-coherent technique used in ADC spectrum testing

Active Publication Date: 2021-09-14
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0010] The purpose of the present invention is to overcome the deficiencies in the prior art, provide a kind of signal recovery method that there is non-coherent sampling and harmonic distortion in ADC spectrum test, break the limitation of coherent sampling condition and harmonic distortion condition, to the measured ADC in non-coherent The sampling signal obtained under the conditions of coherent sampling and harmonic distortion is restored to obtain a coherent sampling signal, so that the ADC can also be accurately tested for the frequency spectrum in the case of non-coherent sampling and harmonic distortion of the ADC sampling signal under test

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  • Signal recovery method in the presence of incoherent sampling and harmonic distortion in adc spectrum testing
  • Signal recovery method in the presence of incoherent sampling and harmonic distortion in adc spectrum testing
  • Signal recovery method in the presence of incoherent sampling and harmonic distortion in adc spectrum testing

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[0099] Specific embodiments of the present invention will be described below in conjunction with the accompanying drawings, so that those skilled in the art can better understand the present invention. It should be noted that in the following description, when detailed descriptions of known functions and designs may dilute the main content of the present invention, these descriptions will be omitted here.

[0100] In order to better illustrate the technical solution of the present invention, firstly, a brief description is given on the problem of spectrum leakage caused by incoherent sampling and the problem of harmonic distortion caused by impure signal source.

[0101] According to the existing research results, the conditions for realizing coherent sampling are as follows:

[0102]

[0103] Among them, M is the total number of sampling points, generally taken as a power of 2, J is the number of sampling periods of the input signal and is an integer, when J is an odd numb...

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Abstract

The invention discloses a signal recovery method with incoherent sampling and harmonic distortion in ADC spectrum testing. First, the fundamental wave is estimated to obtain an amplitude estimated value and an initial phase estimated value, and the incoherent sampling fundamental wave signal is reconstructed. After removing the non-coherent sampling fundamental signal from the ADC output signal under test, the amplitude and initial phase of each harmonic component are estimated, the harmonic signal is reconstructed and removed from the ADC output signal under test, and then the fundamental signal is analyzed based on the residual signal. The wave part is estimated and reconstructed twice, and then the harmonic part is estimated and reconstructed twice, and the fundamental signal and harmonic signal under the coherent sampling condition are reconstructed according to the parameters estimated by the second time, which will be By replacing the incoherent signal in the ADC output signal with a coherent signal, the coherent sampling signal can be recovered from the incoherent sampling signal. By adopting the invention, the ADC can be accurately tested for spectrum under the condition of incoherent sampling and harmonic distortion in the sampled signal of the ADC under test.

Description

technical field [0001] The invention belongs to the technical field of ADC spectrum testing, and more specifically relates to a signal recovery method for non-coherent sampling and harmonic distortion in ADC spectrum testing. Background technique [0002] Analogue-To-Digital Converter (ADC) is a tool for converting analog signals to digital signals. It is widely used in the signal acquisition of various systems. It is an important part of signal acquisition and digital signal processing systems. An important part of the circuit test system. For integrated circuit test systems, it is very important to ensure accurate measurement of ADC parameters. ADC parameters include static parameters and dynamic parameters, dynamic parameter measurement is also called spectrum parameter test. As the resolution of the ADC becomes higher and the sampling speed becomes faster, the difficulty and cost of testing the spectrum parameters of the ADC also increase. Nowadays, the ADC test not o...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R23/16
CPCG01R23/16
Inventor 马敏曾钰琴
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA