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Product defect detection method and device, electronic equipment and storage medium

A product defect and detection method technology, applied in character and pattern recognition, image data processing, instruments, etc., can solve problems such as difficult to unify quality inspection standards, high labor costs, and difficult storage of detection data

Pending Publication Date: 2020-11-24
BEIJING BAIDU NETCOM SCI & TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Traditional appearance defect detection is realized through manual visual inspection, but there are problems such as high labor cost, difficulty in unifying quality inspection standards, difficult storage of inspection data and secondary mining and utilization.

Method used

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  • Product defect detection method and device, electronic equipment and storage medium
  • Product defect detection method and device, electronic equipment and storage medium
  • Product defect detection method and device, electronic equipment and storage medium

Examples

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Embodiment Construction

[0029] Exemplary embodiments of the present application are described below in conjunction with the accompanying drawings, which include various details of the embodiments of the present application to facilitate understanding, and they should be regarded as exemplary only. Accordingly, those of ordinary skill in the art will recognize that various changes and modifications of the embodiments described herein can be made without departing from the scope and spirit of the application. Also, descriptions of well-known functions and constructions are omitted in the following description for clarity and conciseness.

[0030] figure 1 A schematic diagram showing a product defect detection method provided by an embodiment of the present application, such as figure 1 As shown, the method includes:

[0031] Step S11, acquiring the image to be detected of the target product;

[0032] Exemplarily, the target product may include products to be detected for defects in industrial manufa...

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Abstract

The invention discloses a product defect detection method and device, electronic equipment and a storage medium, and relates to the fields of computer vision, image processing, deep learning and the like. According to the specific implementation scheme, the method includes obtaining a to-be-detected image of a target product; determining a color feature difference value between the to-be-detectedimage and a template image according to the color feature value of the to-be-detected image and a pre-stored color feature value of the template image; taking the color feature difference value as a feature value of the first channel to obtain an input image comprising the first channel; and obtaining defect information of the target product according to the input image and the target detection model. According to the embodiment of the invention, the defect detection effect on products with small sizes and weak texture features in an industrial scene can be improved.

Description

technical field [0001] This application relates to the field of computer technology, especially computer vision, image processing, deep learning and other fields. Background technique [0002] In industrial manufacturing scenarios such as component manufacturing scenarios of consumer electronics products, defect detection of product appearance is an important link before product shipment. Traditional appearance defect detection is realized through manual visual inspection, but there are problems such as high labor cost, difficulty in unifying quality inspection standards, and difficult storage and secondary mining of inspection data. Compared with the manual visual inspection scheme, the automatic inspection scheme based on computer vision has the characteristics of stable performance and sustainable iterative optimization. Therefore, it has received extensive attention in the field of defect detection. Contents of the invention [0003] The application provides a product...

Claims

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Application Information

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IPC IPC(8): G06T7/00G06K9/46G06T7/90
CPCG06T7/001G06T7/90G06T2207/10024G06V10/40
Inventor 矫函哲黄锋邹建法聂磊
Owner BEIJING BAIDU NETCOM SCI & TECH CO LTD
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