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Sample table for frozen electron microscope imaging

A technology of cryo-electron microscope and sample stage, which is applied in the direction of material analysis, measuring devices and instruments using wave/particle radiation, and can solve the problem that the sample stage cannot be used for cryo-electron microscope

Pending Publication Date: 2020-11-27
INSITUTE OF BIOPHYSICS CHINESE ACADEMY OF SCIENCES
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The object of the present invention is to provide a sample stage for cryo-electron microscopy imaging, to solve the problem that the existing sample stage cannot be applied to the cryo-electron microscope of Autoloader

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  • Sample table for frozen electron microscope imaging
  • Sample table for frozen electron microscope imaging
  • Sample table for frozen electron microscope imaging

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Embodiment Construction

[0018] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0019] According to an embodiment of the present invention, see Figure 1 to Figure 3 , provides a sample stage for cryo-electron microscopy imaging, including a base 1 and a detachable filling part 2, the base 1 is a disc-shaped structure, the base 1 is provided with a convex edge 3, and the convex edge 3 is surrounded by the base 1 The cavity 4 for accommodating samples, the filling part 2 can fill the stepped structure formed by the outer side wall of the convex e...

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Abstract

The invention discloses a sample table for frozen electron microscope imaging. The sample table comprises a base and a detachable filling part, the base is of a disc-shaped structure, a convex edge isarranged on the base, a cavity used for containing a sample is defined by the convex edge and the base, and the filling part can be used for filling a stepped structure formed by the outer side wallof the convex edge and the base during high-pressure freezing and can be taken down in the pre-thinning process. According to the invention, the high-end freezing transmission electron microscope sample loading ring can be loaded and accommodated, can be stably fixed between the sample loading ring and the sample loading base, can be grabbed by a manipulator in an electron microscope Autodoader, and is placed in a lens cone for imaging. Therefore, the sample table provided by the invention can be applied to a freezing electron microscope of the Autoloader.

Description

technical field [0001] The invention relates to the field of biological sample detection, in particular to a sample stage for cryo-electron microscopy imaging. Background technique [0002] In recent years, thanks to the development of cryo-electron tomography (cryo-ET), in situ structural biology research has developed rapidly. keep improving. Its ultimate goal is to analyze the structure of biological macromolecules and molecular machines in situ, so as to explain the essence of life activities at different levels such as molecules, organelles, and cells. [0003] Cryo-electron tomography generally requires the thickness of the sample to be less than 500nm. Otherwise, too many inelastic scattered electrons will be generated during imaging, which will seriously reduce the signal-to-noise ratio of the photo and make subsequent image processing difficult. Since the thickness of most cell and tissue samples is far beyond 500nm, the technical route adopted for such samples is...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/2251G01N23/2204G01N23/2202
CPCG01N23/2251G01N23/2204G01N23/2202
Inventor 孙磊张建国张丹阳季刚孙飞
Owner INSITUTE OF BIOPHYSICS CHINESE ACADEMY OF SCIENCES