High-low temperature impact test device

Abstract

The invention discloses a high-low temperature impact test device, which comprises a test cabinet body, a high-temperature chamber, a low-temperature chamber, a lifting mechanism, a sealing mechanism,a rapid heating mechanism and a rapid cooling mechanism; the high-temperature chamber is located at the top end in the test cabinet body, the low-temperature chamber is located below the high-temperature chamber, and the bottom end in the low-temperature chamber is provided with a fixed base; the low-temperature chamber and the high-temperature chamber are communicated through a through hole, a sample cavity is formed in the test cabinet body, the side wall of the sample cavity is arranged in a net shape, and a bearing net plate is fixedly installed in the sample cavity. By arranging the lifting mechanism, the lifting mechanism can be used for controlling the sample cavity to move upwards or downwards, transmission between the high-temperature chamber and the low-temperature chamber is achieved, a high-temperature and low-temperature impact test can be rapidly conducted, and the upper sealing assembly and the lower sealing assembly are arranged at the top end and the bottom end of thesample cavity correspondingly; the upper sealing assembly or the lower sealing assembly can be used for sealing the through hole, and airflow in the high-temperature chamber and airflow in the low-temperature chamber are prevented from impacting each other.

Description

technical field [0001] The invention relates to the technical field related to metal material impact testing, in particular to a high and low temperature impact testing device. Background technique [0002] The high and low temperature impact test is a kind of normal pressure thermal test, which is used to test the material structure or composite material, which can withstand the continuous environment of extremely high temperature and extremely low temperature in an instant, and can test the sample due to the shortest time. The chemical changes or physical damage caused by thermal expansion and contraction are characterized by a wide range of temperature changes and a fast temperature change rate; The low temperature test is carried out in the low temperature box, and the performance of the product is evaluated by collecting the parameters after the impact of the temperature environment in the high and low temperature test. [0003] However, the existing high and low tempe...

AI Technical Summary

Problems solved by technology

[0003] However, the existing high and low temperature impact test equipment is inconvenient to transmit the sample in the high temperature zone and the low temperature zone when performing high and low temperature tests on the sample, and it is easy to cause the temperature in the high temperature zone and the low temperature zone to mix, which affects the accuracy of the test , and the existing high and low temperature experimental devices cannot quickly heat up and cool down, resulting in low test efficiency and affecting use, which needs to be improved

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