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Rapid hidden danger detection and diagnosis method based on VI curve fault phenomenon matrix comparison

A diagnostic method and curve technology, applied in the direction of measuring electricity, measuring device, short-circuit test, etc., can solve difficulties and other problems, and achieve the effect of avoiding test errors, avoiding damage, and fast test speed

Pending Publication Date: 2020-12-11
北京唯实兴邦科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, at present, electronic systems and equipment are developing in the direction of miniaturization and large-scale; the internal circuit has the characteristics of high integration, functional modularization, and structural integration, which brings great advantages to equipment circuit testing and diagnosis, especially without diagrams. very difficult
[0003] Relying on traditional instruments and means cannot quickly and effectively complete fault diagnosis and location

Method used

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  • Rapid hidden danger detection and diagnosis method based on VI curve fault phenomenon matrix comparison
  • Rapid hidden danger detection and diagnosis method based on VI curve fault phenomenon matrix comparison
  • Rapid hidden danger detection and diagnosis method based on VI curve fault phenomenon matrix comparison

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Experimental program
Comparison scheme
Effect test

Embodiment 1

[0073] The tester software adopting this method is written by QT;

[0074] Such as Figure 4 As shown, the tester software is used to set instrument functions, analyze and store data, display measurement curves and other functions. The interface is simple and friendly, and the interface schematic diagram;

[0075] The tester software is added with IV matrix function, through multi-channel and multi-point measurement, it can accurately and quickly locate the fault points of complex circuit boards in the form of matrix; the difficulty of this function lies in the determination or selection of test nodes that divide the fault area. According to the current technology, it is proposed to determine the following Two ways of working:

[0076] 1. If Figure 5 As shown, when the netlist or schematic diagram of the circuit board to be tested is known, the test node for the fault area segmentation of the circuit board to be tested can be accurately determined or selected, and the detec...

Embodiment 2

[0082] Such as Figure 6 As shown, the circuit board to be tested is divided into 8 Parts, 4 test nodes T and 2 output points P, which are Part1~Part8 respectively, Part1, Part2, and Part3 are connected in series, and Part4 is connected to Part5, Part6, On Part7; Part7 and Part8 are connected; set to P1 between Part2 and Part3, set to T1 on Part3, set to T2 on Part4, set to T3 on Part5, set to P2 between Part7 and Part8, set to T4 on Part8;

[0083] Through the VI matrix detection, list the matrix list of the unit output and the test node, and test the circuit between the unit output and the test node, as shown in the following table;

[0084]

[0085] In the above table, the circuit fault between the unit output and the test node is marked as "×";

[0086] Diagnose and locate the fault logic input by each channel composed of various units on other circuit boards; the process of traditional fault logic judgment is relatively complicated, and it needs to be tested one by one,...

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Abstract

The invention discloses a rapid hidden danger detection and diagnosis method based on VI curve fault phenomenon matrix comparison. According to the method, a signal generator is connected with a current-limiting resistor, a test object and a sampling resistor in series; a positive electrode and a negative electrode of the test object are connected with a CH1 end and a CH2 end of an oscilloscope; aCOM end of the oscilloscope is connected to the negative electrode of a signal generator; the positive electrode and the negative electrode of the signal generator are connected with the current-limiting resistor and the sampling resistor; and the current-limiting resistor protects the signal generator and the tested object. The method comprises the steps of VI matrix detection, adaptive VI curvetesting and short circuit testing. According to VI matrix detection, a circuit board is divided into a plurality of units, and test nodes are arranged among different units; and then, through a relation between unit output and the test nodes, the circuit state between the unit output and the test nodes is detected, and a unit output test node VI curve fault phenomenon matrix list is formed. The method has the characteristics that a test speed is high, and damage to circuits or elements is avoided.

Description

technical field [0001] The invention relates to a fast hidden danger detection and diagnosis method based on VI curve fault phenomenon matrix comparison, especially a fast hidden danger detection and diagnosis method based on VI curve fault phenomenon matrix comparison which has fast test speed and avoids damage to circuits or components. Background technique [0002] With the rapid development and wide application of electronic technology, the importance of circuit testing technology is becoming more and more obvious. However, at present, electronic systems and equipment are developing in the direction of miniaturization and large-scale; the internal circuit has the characteristics of high integration, functional modularization, and structural integration, which brings great advantages to equipment circuit testing and diagnosis, especially without diagrams. It was very difficult. [0003] Relying on traditional instruments and means cannot quickly and effectively complete ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R31/52
CPCG01R31/2812G01R31/2813G01R31/2803G01R31/52
Inventor 孟双德王可君
Owner 北京唯实兴邦科技有限公司