Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Circuit for trimming and detecting fuse of integrated circuit

A technology of integrated circuits and fuses, which is applied in the direction of electronic circuit testing, circuits, measuring electricity, etc., can solve problems such as chip influence, and achieve the effect of reducing influence

Inactive Publication Date: 2020-12-18
苏州晶耀信息科技有限公司
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, after the trimming is completed, the parasitics of the detection point circuit will have an impact on the inside of the chip.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Circuit for trimming and detecting fuse of integrated circuit

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0013] The circuit used for integrated circuit fuse trimming detection in this embodiment, such as figure 1 As shown, it includes: the first diode D1, the second diode D2 and the fuse FUSE; the anode of the first diode D1 is connected to one end of the fuse FUSE, and the cathode of the first diode D1 is connected to the second two The cathode of the pole tube D2; the anode of the second diode D2 is connected to the other end of the fuse FUSE; the anode of the first diode D1 is also connected to one end of the second resistor R2; the anode of the second diode D2 is also connected to the first One end of a resistor; the other end of the first resistor is connected to the other end of the second resistor R2; the other end of the first resistor is also connected to one end of the third resistor R3 and the fourth resistor R4; the third resistor R3 and the fourth resistor R4 After the other ends are connected to each other, they are connected to one end of the fifth resistor R5; the...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a circuit for trimming and detecting a fuse of an integrated circuit. The circuit comprises a first diode, a second diode, a fuse and a plurality of resistors. According to the circuit for trimming and detecting the fuse of the integrated circuit, the fuse structure can be fused after trimming is completed, a test point is disconnected with an internal circuit after fusing, other connections are isolated by a resistor or a diode, and the overall resistance value of the fuse before and after fusing is basically kept unchanged, so that the influence on the integrated circuit is reduced.

Description

technical field [0001] The invention relates to a fuse trimming circuit for reducing the influence of fuse detection, and belongs to the technical field of integrated circuits. Background technique [0002] For high-precision integrated circuit (chip) design, fuse trimming is required after the chip is manufactured. When trimming, it is necessary to pass the test point of the reserved chip, add an excitation signal, and trim according to the feedback result. However, after the trimming is completed, the parasitics of the detection point circuit will have an impact on the inside of the chip. For high-performance and high-sensitivity circuits, the test structure in the fuse structure will affect its performance. Contents of the invention [0003] The technical problem to be solved by the present invention is: to overcome the shortcomings of the above-mentioned technologies, and provide a fuse trimming detection circuit that can reduce the impact on integrated circuits (chi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R31/28H01L23/525
CPCG01R31/2851H01L23/5256
Inventor 不公告发明人
Owner 苏州晶耀信息科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com