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Wide area optical photothermal infrared spectroscopy

An area and infrared technology, applied in the field of wide-area optical photothermal infrared spectroscopy, can solve the problems of increased sampling time and limitations of OPTIR detectors

Active Publication Date: 2021-01-08
光热光谱股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the measurement accuracy is proportional to the square root of the sampling time, so increasing the accuracy of an OPTIR detector by increasing the sampling time is limited in practice because, for example, increasing the accuracy by an order of magnitude requires increasing the sampling time by a factor of 100

Method used

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  • Wide area optical photothermal infrared spectroscopy
  • Wide area optical photothermal infrared spectroscopy
  • Wide area optical photothermal infrared spectroscopy

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Embodiment Construction

[0020] The present specification describes methods and apparatus for performing optical photothermal infrared (OPTIR) imaging and spectroscopy with improved sensitivity, improved signal-to-noise ratio, and reduced background signal. By using wide-area technology, simultaneous parallel measurements can be made to increase scanning speed and accuracy.

[0021] Several definitions of terms used in this application are provided below.

[0022] "Illumination" means directing radiation onto an object, such as the surface of a sample. Illumination may include any configuration of radiation sources, pulse generators, modulators, reflective elements, focusing elements, and any other beam steering or conditioning elements.

[0023] In the context of light interacting with a sample, the term "interacts" means that light illuminating the sample is scattered, refracted, absorbed, aberrated, turned, diffracted, transmitted and reflected, passed through and / or from the sample by the sample ...

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Abstract

Apparatuses and methods for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations are described herein. These apparatuses and methods improve sampling times while collecting microscopic data regarding composition of a sample across a wide field.

Description

[0001] priority [0002] Embodiments and aspects of the technology in this application are described in U.S. Provisional Application Serial No. 62 / 679,588, filed June 1, 2018, the disclosure of which is incorporated herein by reference. technical field [0003] The present invention relates to the study or analysis of materials by using optical means, ie using infrared, visible or ultraviolet light. Background technique [0004] The present invention relates to infrared spectroscopy and imaging with spatial resolution down to the submicron level using optical photothermal detection techniques. Some optical photothermal techniques have been described in US patents, such as patents 9,091,594 and 9,841,324. These references often refer to the technology by different names and abbreviations. For the purposes of this application, we will collectively refer to these technologies as optical photothermal infrared (OPTIR) in this application. [0005] This general area of ​​OPTIR ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N1/28G01N21/25G02B6/42G02B21/06G02B27/09G06T11/40H04N5/33
CPCG01N21/171G01N2021/1725G02B21/12G02B21/16G02B21/365G02B21/082C12M21/02C12M41/48C12N1/12G02B21/002G06T7/97H04N23/74H04N23/741C12M29/00C12M29/04C12M29/22C12M33/00C12M39/00C12M41/12C12M41/26C12M41/34C12M41/36C12M41/44G01N21/3563G01N2201/061G01N2201/062G02B21/06G06T2207/10048G06T2207/10056G06T2207/10152
Inventor C·普拉特D·德克尔R·谢蒂
Owner 光热光谱股份有限公司
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