Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A large field of view high-precision structural deformation measurement system in a simulated space environment

A technology for simulating space and structural deformation, applied in the aerospace field to ensure high stability, easy implementation, and overcoming influences

Active Publication Date: 2022-07-05
BEIJING SATELLITE MFG FACTORY
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The technical problem of the present invention is to overcome the deficiencies of the prior art and provide a large-field-of-view high-precision structural deformation measurement system in a simulated space environment to solve the problem of large-field-of-view high-precision structural deformation field measurement in a simulated environment

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A large field of view high-precision structural deformation measurement system in a simulated space environment

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0042] In order to make the objectives, technical solutions and advantages of the present invention clearer, the embodiments disclosed in the present invention will be described in further detail below with reference to the accompanying drawings.

[0043] Aiming at the problems existing in traditional measurement methods in the application of high-stability structural deformation measurement of spacecraft, the present invention proposes a large-field high-precision simulation space environment based on the combination of image stitching, large-field-of-view scanning, baseline protection and digital image technology. The structural deformation measurement system solves the problem of high-precision structural deformation field measurement in a large field of view in a simulated environment. The invention is suitable for high-precision deformation field measurement of large-scale structures in a simulated space environment, and is also suitable for structural deformation field me...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a high-precision structural deformation measurement system with a large field of view in a simulated space environment, comprising: a space environment simulation tank, an installation bottom plate, a measurement base, a measurement motion mechanism, a measurement motion chute structure, a motion mechanism control circuit, Motion mechanism control software and hardware system, local environment control and visual measurement circuit, local environment control and visual measurement software and hardware system and image acquisition unit; both ends of the measurement base are respectively connected to the space environment simulation tank and the measurement movement chute structure; measurement The motion mechanism is structurally connected to the measurement motion chute; the image acquisition unit and the installation base plate are sequentially arranged below the measurement motion mechanism; the motion mechanism control software and hardware system is connected to the measurement motion mechanism through the motion mechanism control circuit; the local environment control and visual measurement software and hardware systems It is connected to the image acquisition unit through local environmental control and vision measurement lines. The invention solves the problem of high-precision structural deformation field measurement with a large field of view in a simulated environment.

Description

technical field [0001] The invention belongs to the field of aerospace technology, and in particular relates to a large field of view high-precision structural deformation measurement system in a simulated space environment. Background technique [0002] In order to ensure the stability and reliability of high-precision measurement satellites and on-board equipment indicators, the load installation reference structure must have high stability characteristics, that is, the structure only produces small deformation or "near zero deformation" in the space environment. High-stability structures represented by high-precision fixed-surface antennas and precision load brackets have a significant impact on the accuracy of the spacecraft, directly determining the performance of the whole device, and even related to the success or failure of the mission. In the simulated space environment, obtaining its stability performance parameters with high precision and real time is the core lin...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/16G01B11/00
CPCG01B11/167G01B11/002
Inventor 唐小军回天力于文涛杨凤龙孙子杰田欣李大松郑立豪
Owner BEIJING SATELLITE MFG FACTORY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com