Test case regression method, device and equipment and storage medium
A test case and regression method technology, applied in the field of integrated circuits, can solve problems such as complex verification environment, exceeding disk capacity, occupying computing resources and disk resources, etc., to achieve the effect of improving regression efficiency and reducing occupation
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[0031] The technical solutions in the embodiments of the present application will be described below with reference to the drawings in the embodiments of the present application. In the description of the present application, the terms "first", "second" and the like are only used for distinguishing descriptions, and cannot be understood as indicating or implying relative importance.
[0032] Such as figure 1 As shown, this embodiment provides an electronic device 1, including: at least one processor 11 and a memory 12, figure 1 Take a processor as an example. Processor 11 and memory 12 are connected via bus 10 . The memory 12 stores instructions that can be executed by the processor 11, and the instructions are executed by the processor 11, so that the electronic device 1 can execute all or part of the process of the method in the following embodiments to regress the test cases of the integrated circuit .
[0033] In one embodiment, the electronic device 1 may be a mobile ph...
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