Test case regression method, device and equipment and storage medium

A test case and regression method technology, applied in the field of integrated circuits, can solve problems such as complex verification environment, exceeding disk capacity, occupying computing resources and disk resources, etc., to achieve the effect of improving regression efficiency and reducing occupation

Active Publication Date: 2021-02-19
HYGON INFORMATION TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The verification environment is becoming more and more complex, and there are more and more test cases. In order to improve efficiency, the existing technical solutions generally regress the wrong use case only when the test case fails,

Method used

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  • Test case regression method, device and equipment and storage medium
  • Test case regression method, device and equipment and storage medium
  • Test case regression method, device and equipment and storage medium

Examples

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Embodiment Construction

[0031] The technical solutions in the embodiments of the present application will be described below with reference to the drawings in the embodiments of the present application. In the description of the present application, the terms "first", "second" and the like are only used for distinguishing descriptions, and cannot be understood as indicating or implying relative importance.

[0032] Such as figure 1 As shown, this embodiment provides an electronic device 1, including: at least one processor 11 and a memory 12, figure 1 Take a processor as an example. Processor 11 and memory 12 are connected via bus 10 . The memory 12 stores instructions that can be executed by the processor 11, and the instructions are executed by the processor 11, so that the electronic device 1 can execute all or part of the process of the method in the following embodiments to regress the test cases of the integrated circuit .

[0033] In one embodiment, the electronic device 1 may be a mobile ph...

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Abstract

The invention provides a test case regression method and device, equipment and a storage medium, and the method comprises the steps: searching an error information historical record when a current test case goes wrong, and judging whether there is a previous error record of the same type as the current test case in the error information historical record or not; if the previous error record does not exist in the error information historical record, obtaining configured regression parameters of the current test case; and performing re-regression on the current test case based on the regressionparameters to generate a re-regression waveform of the current test case. According to the method, occupation of computing resources and disk resources in integrated circuit test case regression can be reduced, and the regression efficiency is improved.

Description

technical field [0001] The present application relates to the technical field of integrated circuits, in particular, to a test case regression method, device, equipment and storage medium. Background technique [0002] SOC (System on Chip, system-on-chip) is a system or product formed by combining multiple integrated circuits with specific functions on a chip, which includes a complete hardware system and its embedded software. In a broad sense, SOC is a tiny system. If the central processing unit (CPU) is the brain, then the SOC is a system including the brain, heart, eyes and hands. [0003] SOC-related content includes integrated circuit design, system integration, chip design, production, packaging, test verification, and more. With the development of information technology, SOC has more and more functions and larger scale, and the verification environment corresponding to it is also more and more complex. Taking SOC design verification as an example, generally speakin...

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Application Information

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IPC IPC(8): G06F11/36
CPCG06F11/3688G06F11/3692
Inventor 沈旭王芳杨晶晶
Owner HYGON INFORMATION TECH CO LTD
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