Detection sensor device based on synthetic aperture principle and system method thereof

A technology for detecting sensors and synthetic apertures, which is used in measuring devices, instruments, scientific instruments, etc., to achieve precise position detection signal fusion, improve ultrasonic detection accuracy, and fast non-destructive testing results.

Active Publication Date: 2021-03-16
EDDYSUN (XIAMEN) ELECTRONICS CO LTD +2
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

The diversity of composite materials also brings new challenges to non-destructive testing technology

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  • Detection sensor device based on synthetic aperture principle and system method thereof
  • Detection sensor device based on synthetic aperture principle and system method thereof
  • Detection sensor device based on synthetic aperture principle and system method thereof

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Embodiment Construction

[0034] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0035] Such as Figure 1 to Figure 4As shown, a detection sensor device based on the principle of synthetic aperture, including a housing 1, an ultrasonic transducer element 2 and an eddy current sensor element 3, is characterized in that the ultrasonic transducer element 2 arranged in the housing 1 includes a plurality of The ultrasonic wafer 21 is an annular spacer layer, and the eddy current sensor element 3 includes a plurality of eddy current sensor coils 31 arranged at intervals in an annular shape.

[0036] Wherein the annular ultrasonic wafer 21 and the annular eddy current sensor coil 31 are arranged to surround the same circle center annular interval array, between the adjacent annular ultrasonic wafer 21 of the same circle center annular interval array and the annular eddy current sensor coil 31 is the annular detection with insulati...

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Abstract

The invention discloses a detection sensor device based on a synthetic aperture principle and a system method thereof. The detection sensor device based on the synthetic aperture principle comprises ashell (1), an ultrasonic transduction element (2) and an eddy current sensor element (3), and is characterized in that the ultrasonic transduction element (2) arranged in the shell (1) comprises a plurality of annular spacer layer ultrasonic wafers (21); the eddy current sensor element (3) comprises a plurality of eddy current sensor coils (31) which are annularly arranged at intervals, and the annular ultrasonic wafer (21) and the annular eddy current sensor coils (31) are arranged in an annular interval array around the same circle center. Annular detection sensor pairs L1-Ln spaced by an insulating layer (4) are arranged between the annular ultrasonic wafer (21) and the annular eddy current sensor coil (31) which are arranged in a concentric annular spaced array, and each pair L1-Ln isset to output a detection signal through the same channel. Signals of ultrasonic waves and eddy currents at the same detection object position are obtained at the same time, effective information fusion judgment can be conducted, and accurate position detection signal fusion is achieved.

Description

technical field [0001] The invention relates to the technical fields of electromagnetic nondestructive testing and ultrasonic nondestructive testing, in particular to a sensor device for nondestructive testing, in particular to a detection sensor device based on the principle of synthetic aperture and a system method thereof. Background technique [0002] Modern industry cannot do without advanced composite materials. The diversity of composite materials also brings new challenges to non-destructive testing technology. In order to solve the problem of composite material quality detection faster and better, especially the in-service detection of metal and non-metal composite materials, many new NDT methods have been invented. For composite materials such as weakly conductive carbon fiber materials, electromagnetic eddy current and acoustic testing methods are usually used to perform testing separately, and the results of the testing data are fused for analysis and judgment t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/904G01N29/04G01N29/22
CPCG01N27/904G01N29/04G01N29/22Y02E30/10
Inventor 林俊明张碧星蔡桂喜沈建中吴晓瑜戴永红沈淮
Owner EDDYSUN (XIAMEN) ELECTRONICS CO LTD
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