High-low-temperature low-air-pressure testing device

A high-low-low-low-pressure, testing device technology, used in heating or cooling equipment, laboratory utensils, shells or chambers, etc., can solve problems such as unfavorable experimental product removal, and achieve a high-quality product that avoids internal temperature rise and is easy to take. Effect

Inactive Publication Date: 2021-03-30
万久科技发展(无锡)有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] However, during the use of the high-low temperature and low-pressure test box, it is usually necessary to open the box cover and then the operator takes the experimental product, which is not conducive to the removal of the experimental product.

Method used

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Embodiment Construction

[0023] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0024] see Figure 1~4 , in the embodiment of the present invention, a kind of high and low temperature low air pressure testing device comprises electric box 1, and the top surface of electric box 1 is fixedly connected with experiment box 2, and electric box 1 is provided with air pump 3, three-way solenoid valve 4 and circulation The model of the cooling machine 5 and the three-way solenoid valve 4 is JYZ-3C1, which is manufactured and sold by Ningbo Jiayin...

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Abstract

The invention discloses a high-low-temperature low-air-pressure testing device, which comprises an experiment box, a moving mechanism, a fan, a lamp, an observation window, a first door body and a second door body. According to the high-low-temperature low-air-pressure testing device, during detection, the first door body is closed firstly to close the interior of the experiment box, then the second door body is opened, the moving mechanism extends out of the experiment box conveniently, then the motor is controlled to start working through the switch, the motor starts the electric lead screwto rotate, and the lead screw drives the sliding block to slide on the sliding rail through the connecting threaded block; the slide block drives the mounting plate to extend out of the experiment boxthrough the second door body, then an electronic product to-be-detected is placed in the mounting plate, the threaded handle is rotated, and the threaded handle drives the abutting block to abut against the outer side of the electronic product, so that the electronic product is fixed to the mounting plate, and then the motor is controlled to rotate reversely through the switch. Therefore, the electronic product is driven by the moving mechanism to enter the experiment box, and then the experiment box is closed when the second door body is closed.

Description

technical field [0001] The invention relates to the field of electronic product testing, in particular to a high-low temperature and low air pressure testing device. Background technique [0002] High-low temperature and low-pressure test chambers are mainly used in aviation, aerospace, electronics, national defense, scientific research and other industrial sectors to determine electronic technology products (including components, materials and instruments). Under the single or simultaneous action of high and low temperature and low pressure, the reliability test of storage and transportation can be carried out, and the electrical performance parameters can be tested by electrifying the test piece at the same time. [0003] However, during the use of the high-low temperature and low-pressure test box, it is usually necessary to open the box cover and then the operator takes the experimental product, which is not conducive to the removal of the experimental product. Content...

Claims

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Application Information

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IPC IPC(8): B01L1/00B01L7/00
CPCB01L1/00B01L7/00
Inventor 徐士林
Owner 万久科技发展(无锡)有限公司
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