Open circuit and short circuit testing device

Abstract

The invention relates to the technical field of chip testing, and particularly discloses an open circuit and short circuit testing device. The device comprises a switching module, a measuring module and a main control module, a chin pin, the switching module, the measuring module and the main control module are connected in sequence. The switching module is switched between a first state and a second state so as to change the trend of the forward test current output by the measurement module, and when the switching module is in the first state, the forward test current output by the measurement module forms a first path through the chip pin, the first clamping diode, the chip ground end and the isolation ground end; in the second state, the forward test current output by the measurement module forms a second path through the chip ground end, the second clamping diode, the chip pin and the isolation ground end; the measurement module is used for measuring and preprocessing the voltage on the first path and the second path; and the main control module is used for determining whether the chip pin is open-circuited or short-circuited according to the preprocessed voltage. The device is suitable for open-circuit and short-circuit tests of high-voltage chips, and is low in cost and high in precision.

Description

technical field [0001] The invention relates to the technical field of chip testing, in particular to an open-short circuit test device. Background technique [0002] In the technical field of chip testing, the open-short test is a necessary test item, which is used to detect whether each pin of the chip is short-circuited or open-circuited. The general open-short circuit test method is to output the test current to the pin of the chip under test, collect the voltage of the upper and lower clamping diodes of the pin, and judge whether the chip pin is open or short circuit according to the voltage value. For high-voltage chips, it is often necessary to customize a high-voltage PMU (parametric measurement unit, parameter measurement unit) chip from the chip supplier, and use it in ATE (Automatic Test Equipment, automatic test machine) to perform open and short circuit tests on its chip pins, or pass A variety of discrete components are used to build high-voltage PMU functiona...

AI Technical Summary

Problems solved by technology

[0003] Based on this, it is necessary to provide an open-short test device for how to realize low-cost, high-precision high-voltage chip pin open-short circuit test

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