Unlock instant, AI-driven research and patent intelligence for your innovation.

Test method for improving characteristic X-ray intensity value

A test method, X-ray technology, applied in measurement devices, material analysis using wave/particle radiation, instruments, etc., can solve the problems of increasing electron beam current, inaccurate test results, increasing test time, etc., to reduce detection limit, avoid element migration, and improve the effect of total strength

Inactive Publication Date: 2021-04-30
CHINA UNIV OF GEOSCIENCES (WUHAN)
View PDF4 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Currently, increasing the I unk The method of increasing the value includes changing the acceleration voltage, increasing the electron beam current and increasing the test time, and these methods are likely to cause the test sample to be destroyed and the element migration to occur, resulting in inaccurate test results

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Test method for improving characteristic X-ray intensity value
  • Test method for improving characteristic X-ray intensity value
  • Test method for improving characteristic X-ray intensity value

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0031] The present invention will be further described in detail below in conjunction with the embodiments, so that those skilled in the art can implement it with reference to the description.

[0032] The invention provides a test method for improving the characteristic X-ray intensity value, comprising:

[0033] Multiple spectroscopic crystals are installed on the spectrometer of the electronic probe to form a test system for the element to be measured; multiple spectroscopic crystals on different spectrometers can be the same spectroscopic crystal, and multiple spectroscopic crystals on different spectrometers can be different. Spectroscopic crystals; each spectroscopic crystal is denoted as CY1, CY2, ..., CYn (n is an integer ≥ 2). In the embodiment of the present invention, the plurality of spectroscopic crystals are three spectroscopic crystals of PETL1, PETL2 and PETL3 installed on three different spectrometers.

[0034] To obtain the total net count of the analyte in ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a test method for improving a characteristic X-ray intensity value, which comprises the following steps: forming a test system of an element to be tested by using a plurality of light splitting crystals on different spectrographs of an electronic probe, and simultaneously testing the same element to be tested; obtaining the total net count of the to-be-detected elements in the standard sample; obtaining the total net count of the to-be-detected elements in the to-be-detected sample; calculating the concentration of the to-be-detected element in the to-be-detected sample according to the total net count of the to-be-detected element in the standard sample, the total net count of the to-be-detected element in the to-be-detected sample and the concentration of the to-be-detected element in the standard sample; and according to the background intensity of the to-be-detected element in the to-be-detected sample on each light splitting crystal, obtaining the total background intensity of the to-be-detected element in the to-be-detected sample, and further calculating the detection limit of the to-be-detected element. According to the method, the Iunk value can be increased, the detection limit of the test is reduced, or the test current is reduced on the premise of not changing the Iunk value, so that the phenomenon of element migration caused by damage to the to-be-tested sample is avoided.

Description

technical field [0001] The invention relates to the technical field of electronic probe testing. More specifically, the present invention relates to a test method for increasing characteristic X-ray intensity values. Background technique [0002] As a micro-area in-situ analysis method, the electron probe can quickly and accurately analyze the element concentration of solid samples, and has been widely used in geology, material science and other fields, mainly for the analysis and testing of major elements. Compared with other micro-area in-situ analysis and testing methods, electronic probes have the characteristics of small spatial resolution, non-destructive, and accurate testing. Therefore, the use of electronic probes to carry out micro-area in-situ trace element analysis has also attracted more and more attention. [0003] The basic principle of the electron probe is to generate X-rays according to the bombardment of the sample by the electron beam, and compare the in...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/2252
CPCG01N23/2252
Inventor 杨水源崔继强蒋少涌张若曦
Owner CHINA UNIV OF GEOSCIENCES (WUHAN)