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Detection method of line defect of display panel

A technology for displaying panel and line defects, which is applied in the direction of measuring devices, instruments, scientific instruments, etc., can solve the problems of low detection accuracy and unsatisfactory detection effect, and achieve good detection effect, simple and efficient detection method, and high detection accuracy Effect

Active Publication Date: 2022-07-29
SHENZHEN CHINA STAR OPTOELECTRONICS SEMICON DISPLAY TECH CO LTD
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Problems solved by technology

[0005] The disclosed embodiment provides a detection method for line defects of a display panel to solve the problems of low detection accuracy and unsatisfactory detection effect in the detection of products in the existing detection technology

Method used

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  • Detection method of line defect of display panel
  • Detection method of line defect of display panel
  • Detection method of line defect of display panel

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Embodiment Construction

[0029] The technical solutions in the embodiments of the present disclosure will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present disclosure. Obviously, the described embodiments are only some, but not all, embodiments of the present disclosure. Based on the embodiments in the present disclosure, all other embodiments obtained by those skilled in the art without creative efforts fall within the protection scope of the present disclosure.

[0030] The circuit layout inside the display panel is relatively complex. Therefore, after the preparation of each process of the display panel, it is generally necessary to test the quality of the set circuit. Traditional detection methods often have low detection accuracy, and the detection process is complex and cannot be intuitive. reflects the defects existing in the line area.

[0031] In an embodiment of the present disclosure, a method for detecting line defects ...

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Abstract

An embodiment of the present disclosure provides a method for detecting a line defect of a display panel. First, the line wiring area corresponding to the display panel is collected, and the collected information is converted into a corresponding image, and then the obtained image is analyzed, and the same area is respectively analyzed. The pixels in the display panel are marked, and then the circuit wiring structure of the display panel is analyzed according to all the marking results. In the embodiment of the present disclosure, by converting lines into pixel units and making judgments according to the marking results corresponding to the pixel units, the detection method is simple, efficient, and has high precision, and the detection effect is good.

Description

technical field [0001] The present disclosure relates to the technical field of display panels, and in particular, to a method for detecting circuit defects of a display panel. Background technique [0002] With the continuous development of display technology, the performance and quality of each display device are continuously improved to meet the various needs of users. [0003] Therefore, the use quality of the display panel will directly affect the user's use experience. In order to ensure that the factory display panel is a qualified product, it needs to be tested. Among them, the automatic optical inspection machine (auto optical inspection, AOI) is the main equipment for detecting defects in the display panel and semiconductor industries. In the existing inspection technology, the inspection object is firstly imaged by an imaging unit and digitally processed in gray scale, and then the defects are detected by image comparison. However, the objects of the above dete...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/956
CPCG01N21/956G01N2021/95638
Inventor 陈少甫
Owner SHENZHEN CHINA STAR OPTOELECTRONICS SEMICON DISPLAY TECH CO LTD
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