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Degradation modeling and life prediction method considering performance index clustering in dynamic environment

A dynamic environment and life prediction technology, applied in design optimization/simulation, character and pattern recognition, instruments, etc., can solve problems such as difficult operation, complex Copula function form, difficult Copula function, etc., and achieve good explanatory effect

Active Publication Date: 2022-07-26
BEIHANG UNIV
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Problems solved by technology

The use of multidimensional distribution to describe the degradation process of product performance indicators has the following limitations: (1) All performance indicators are required to meet the same degradation law, that is, the individual degradation models of each indicator are consistent; (2) The degradation amount or degradation increase of each indicator is required Quantities follow the same distribution
[0010] Although the Copula function can handle complex correlations more flexibly, there are still many shortcomings: (1) How to choose an appropriate Copula function is still a difficult problem; (2) Most of the Copula functions are complex in form and difficult to operate in practice

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  • Degradation modeling and life prediction method considering performance index clustering in dynamic environment
  • Degradation modeling and life prediction method considering performance index clustering in dynamic environment
  • Degradation modeling and life prediction method considering performance index clustering in dynamic environment

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Embodiment Construction

[0073] The present invention verifies the feasibility of the proposed model through simulation experiments. The object of simulation is DT830 digital multimeter, which includes five measurement gears: DC voltage (DCV), DC current (DCA), DC resistance (DCR), AC voltage (ACV), AC current (ACA), each The measurement gears have several different ranges. When the measurement error of any one of the measurement gears of the multimeter exceeds a certain range, it is considered invalid. Therefore, the measurement error under the highest range of the five gears is used as the five performance indicators of the multimeter for simulation. These five performance indicators are actually affected by the degradation of two sets of key common components inside the multimeter and have a degradation trend, namely 1) voltage divider / shunt resistance; 2) integrated chip ICL7160 and LCD. The voltage divider / shunt resistance can be subdivided into two groups, one of which controls the DC voltage r...

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Abstract

The invention relates to a degradation modeling and life prediction method considering performance index clustering in a dynamic environment, and belongs to the technical field of degradation modeling and life prediction. Firstly, the test data is collected, then the performance index degradation model is established, and the unknown parameters in the model are estimated, and finally the life and reliability prediction is carried out. The specific steps are: step 1: collect test data; step 2: establish a degradation model; step 3: estimate parameters and update the model in real time; step 4: predict life and reliability. For the phenomenon that each index of multi-performance index products shows "clustering" due to the influence of common potential factors, mathematical modeling is carried out, which makes the degradation modeling of products with this phenomenon more realistic, and the difference between indexes is more realistic. The origin of the correlation is better explanatory.

Description

technical field [0001] The invention relates to a degradation modeling and life prediction method considering performance index clustering in a dynamic environment, and belongs to the technical field of degradation modeling and life prediction. Background technique [0002] With the development of science and technology, many products are designed with high reliability and long life, which makes it difficult to conduct life tests and obtain product failure data. Therefore, traditional reliability modeling and life prediction based on failure data methods become difficult to adapt to real-world needs. The improvement of sensor technology and the rise of fault prediction and health management technology have made it possible to obtain a large amount of data related to product performance degradation, and product degradation modeling and life prediction technology based on degradation data have also received extensive attention and research. [0003] At present, most degradati...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/20G06K9/62G06F119/04
CPCG06F30/20G06F2119/04G06F18/23
Inventor 黄婷婷吴鑫黄沐林戴伟
Owner BEIHANG UNIV