Degradation modeling and life prediction method considering performance index clustering in dynamic environment
A dynamic environment and life prediction technology, applied in design optimization/simulation, character and pattern recognition, instruments, etc., can solve problems such as difficult operation, complex Copula function form, difficult Copula function, etc., and achieve good explanatory effect
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[0073] The present invention verifies the feasibility of the proposed model through simulation experiments. The object of simulation is DT830 digital multimeter, which includes five measurement gears: DC voltage (DCV), DC current (DCA), DC resistance (DCR), AC voltage (ACV), AC current (ACA), each The measurement gears have several different ranges. When the measurement error of any one of the measurement gears of the multimeter exceeds a certain range, it is considered invalid. Therefore, the measurement error under the highest range of the five gears is used as the five performance indicators of the multimeter for simulation. These five performance indicators are actually affected by the degradation of two sets of key common components inside the multimeter and have a degradation trend, namely 1) voltage divider / shunt resistance; 2) integrated chip ICL7160 and LCD. The voltage divider / shunt resistance can be subdivided into two groups, one of which controls the DC voltage r...
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