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Method and device for ki-based operation of an automation system

A technology of automation systems and equipment, applied in the field of automation systems, can solve problems such as low error rates

Pending Publication Date: 2021-05-25
SIEMENS AG
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, on the one hand, since the error rate of modern production facilities is very low and correspondingly only a small number of errors occur, it will take a considerable time until the data required for the further training of the KI system are available until now

Method used

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  • Method and device for ki-based operation of an automation system
  • Method and device for ki-based operation of an automation system
  • Method and device for ki-based operation of an automation system

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Embodiment Construction

[0031] figure 1 An automation system 1 is shown, which controls a plant 100 , which is exemplarily designed as a production plant, or its machines 110 , 120 by means of its control device 10 . A production facility 100 for the automatic production of at least a part of the products A, B, C is merely exemplary chosen as a facility controllable by such an automation system 1 . In general, it applies that the automation system 1 can be used, for example, in factory automation or also in process automation, and a plant 100 corresponding to the field of application is controlled by means of the control device 10 of the automation system. In the following, it is only assumed as an example that the plant 100 to be controlled is a production plant which is used for the production of different objects or products A, B, C. FIG. Here, A, B or C represent a product type or a product group rather than a corresponding individual object.

[0032] Within the framework of quality control, on...

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Abstract

The invention provides a method and a device for KI-based operation of an automation system. A control device of an automation system, which is configured to control a plant, such as a production plant, including using an AI system, is provided. In an application of the control device, the device monitors the production with regard to the quality of the objects produced, for example, with regard to the presence of fault cases. The AI system is trained in advance based on a plurality of known states of the objects, so that the AI system may be trained for the occurrence of new, previously unknown states, where only a small number of example cases are required.

Description

technical field [0001] The invention relates to an automation system and in particular to a control device of the automation system for controlling a plant, for example a production plant. Background technique [0002] The controllers of modern automation systems, for example for the automatic production of products A, B, C, already use artificial intelligence (KI) for controlling, for example, the process to be automated, ie the KI system is implemented in the corresponding controller. These KI systems can be used, for example, to check the quality of produced products within the framework of automated production processes, for example with respect to possible damage or incorrect assembly of products or the like. It has been shown that a trained KI system satisfies this purpose extremely reliably if the error to be detected is included in the previous training of the KI system. It is well known that such training is based on extremely large data records consisting, for exa...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F16/906G06N3/04G06N3/08
CPCG06F16/906G06N3/04G06N3/08G05B19/41875Y02P90/02G05B13/027G06F18/2148
Inventor F·贝特纳R·格罗斯S·利默I·托恩
Owner SIEMENS AG