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SAR image multi-type building height estimation method based on overlay information

A technology of building height and building, applied in the field of image processing, can solve problems such as low computational efficiency and limited practicability, and achieve the effect of enhancing accuracy

Active Publication Date: 2021-06-01
CHINA UNIV OF GEOSCIENCES (WUHAN)
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the low computational efficiency of TomoSAR-based building height estimation methods limits the practicability of such methods.

Method used

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  • SAR image multi-type building height estimation method based on overlay information
  • SAR image multi-type building height estimation method based on overlay information
  • SAR image multi-type building height estimation method based on overlay information

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Embodiment Construction

[0043] In order to make the purpose, technical solution and advantages of the present invention clearer, the embodiments of the present invention will be further described below in conjunction with the accompanying drawings.

[0044] The method for estimating the height of multi-type buildings in SAR images based on overlapping information of the present invention comprises the following steps:

[0045] The overlapping areas of buildings are extracted from high-resolution SAR images, and the overlapping areas are qualitatively classified according to the shape variation parameters of the overlapping areas, which are divided into: low-rise building overlapping areas, and middle-rise building overlapping areas districts and high-rise building overlapping areas;

[0046] Extracting the overlay size information of the low-rise building overlay area, the middle-rise building overlay area and the high-rise building overlay area respectively;

[0047] The height of the building is e...

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Abstract

The invention provides an SAR image multi-type building height estimation method based on overlay information. The method comprises the following steps: extracting overlaying areas of a building from a high-resolution SAR image, and carrying out qualitative classification on the overlaying areas according to shape variation parameters of the overlaying areas, so as to divide the overlaying areas into a low-rise building overlaying area, a middle-rise building overlaying area and a high-rise building overlaying area; respectively extracting overlaying size information of the low-rise building overlaying area, the middle-rise building overlaying area and the high-rise building overlaying area by adopting different extraction methods; and estimating the height of the building according to the overlay size information and the imaging geometrical relationship of the building. According to the method, different building height information extraction methods are adopted according to different building types, and accurate floor height information can be effectively extracted.

Description

technical field [0001] The invention relates to the technical field of image processing, in particular to a method for estimating the height of multi-type buildings in SAR images based on overlapping information. Background technique [0002] As the most important basic element in the urban three-dimensional information construction system, the height of buildings plays an important role in alleviating a series of problems such as the reduction of urban area per capita and the waste of space resources. The initial building height information is mainly obtained through manual field measurement using the traditional ground measurement method, but this method cannot meet the monitoring needs of the rapid urbanization process. Synthetic aperture radar (SAR), as an active microwave remote sensing technology, can not be affected by the imaging time period, and has strong anti-interference ability against adverse weather factors and natural conditions such as clouds and fog, so tha...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/00G06K9/32G06K9/62G06T7/12G06T7/181G06T7/60
CPCG06T7/60G06T7/12G06T7/181G06T2207/10044G06V20/176G06V10/255G06F18/2431
Inventor 陈启浩王仁政刘修国张正加
Owner CHINA UNIV OF GEOSCIENCES (WUHAN)