Check patentability & draft patents in minutes with Patsnap Eureka AI!

Method for analyzing frequency response of optical electric field sensor

An optical electric field and frequency response technology, applied in instruments, measuring electrical variables, measuring devices, etc., can solve problems such as amplitude error and phase shift, and achieve the effect of improving measurement accuracy and facilitating error correction

Pending Publication Date: 2021-06-04
TSINGHUA UNIV +2
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Amplitude errors and phase shifts may occur when an electric field sensor measures at a certain frequency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for analyzing frequency response of optical electric field sensor
  • Method for analyzing frequency response of optical electric field sensor
  • Method for analyzing frequency response of optical electric field sensor

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0014] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0015] A method of analyzing the frequency response of an optical electric field sensor comprising the steps of:

[0016] Step 1, measure the equivalent capacitance C of the upper plate and the upper shell of the sensor a1 and equivalent resistance R a1 , measure the equivalent capacitance C of the lower plate and the lower shell of the sensor a2 and equivalent resistance R a2 , measure the equivalent capacitance C between the upper shell and the lower shell of the sensor 1 and equivalent resistance R 1 , measure the equivalent capacitance C of the sensor upper shell to the optical waveguide u...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a method for analyzing frequency response of an optical electric field sensor, and belongs to the technical field of electric field measurement. The method comprises the following steps: step 1, measuring related equivalent capacitance and equivalent resistance; 2, establishing a measurement equivalent circuit according to the measurement data in the step 1, and establishing an equivalent function according to the equivalent circuit; and 3, calculating measurement errors of the optical electric field sensor under different frequencies according to the transfer function established in the step 2. The method for analyzing the frequency response of the optical electric field sensor provided by the invention can quantitatively analyze the measurement error of the sensor under different frequencies, and is convenient for correcting the error to improve the measurement precision.

Description

technical field [0001] The invention relates to a method for analyzing the frequency response of an optical electric field sensor, belonging to the technical field of electric field measurement. Background technique [0002] Connect the positive and negative poles of the high voltage voltage to the upper and lower plates used to generate the electric field, and the electric field to be measured is generated between the plates. Place the electric field sensor in the electric field to be measured, the dielectric of the external space of the sensor, the water vapor pollution on the surface of the sensor, the shell material of the sensor and the internal structure of the sensor jointly determine the frequency response of the electric field sensor. When an electric field sensor measures at a certain frequency, amplitude errors and phase shifts may occur. By establishing an electric field sensor measurement equivalent circuit, the amplitude error and phase shift measured by the e...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R35/00
CPCG01R35/00
Inventor 王涉朱太云耿屹楠刘宇舜夏令志王刘芳邱欣杰
Owner TSINGHUA UNIV
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com