Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Passivity correction method and device for integrated circuit system

A technology of integrated circuit and correction method, which is applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., can solve the problems of long time consumption and large calculation amount, and achieve the goal of reducing dimensionality, reducing calculation amount, and improving calculation efficiency Effect

Active Publication Date: 2021-06-04
北京华大九天科技股份有限公司
View PDF10 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0011] The embodiment of the present invention provides a passivity correction method and device for an integrated circuit system to solve the problem of large amount of calculation and long time consumption when calculating the quadratic term matrix in passivity correction in the prior art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Passivity correction method and device for integrated circuit system
  • Passivity correction method and device for integrated circuit system
  • Passivity correction method and device for integrated circuit system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0084] Below, give examples to illustrate the specific implementation of the present invention, but the implementation of the present invention is not limited by these following examples, can make arbitrary selection and change in the scope that does not affect the technical effect that the present invention will achieve .

[0085] In order to make the present invention easier to understand, the terms used are defined as follows.

[0086] Such as figure 1 As shown, it is a flow chart of a passivity correction method for an integrated circuit system provided by an embodiment of the present invention, and the method may include the following steps:

[0087] Step 110, calculating the frequency response of each pole at each frequency output by the S-parameter vector fitting output.

[0088] In the disclosed steps, each pole is the output from the vector fitting of the S parameter, and the number of poles is N q , for each pole, compute its frequency response at each frequency ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a passivity correction method for an integrated circuit system. The passivity correction method comprises the steps that the frequency response of each pole under each frequency, which is output by S parameter vector fitting, is calculated; according to the frequency response of each pole, determining a reduced residue gradient vector corresponding to each frequency; according to the residue gradient vector, determining a quadratic term matrix corresponding to the full frequency of each frequency; and performing Kronecker product operation on the full-frequency quadratic term matrix to determine a final quadratic term matrix. According to the method, the dimensionality of the matrix in the operation process is reduced, the operation amount is greatly reduced, the operation time is shortened, and the calculation efficiency of the quadratic term matrix is improved.

Description

technical field [0001] The invention relates to the technical field of integrated circuits, in particular to a passivity correction method and device for integrated circuit systems. Background technique [0002] In large-scale integrated circuits, passive devices and their circuits are very important components. For example, a transmission line used to connect different circuit modules in an integrated circuit can transmit signals in different circuit modules, and is an important part of the integrated circuit. In circuit design, if the passive components and their circuit design are wrong, the complete performance of the integrated circuit cannot be accurately obtained. At present, S parameters are usually used to describe passive devices and their circuits, and the S parameters at different frequencies are measured through experiments to define passive devices. [0003] There are many ways to use S parameters to model passive devices. A common method is to convert passiv...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F30/367G06F30/398
CPCG06F30/367G06F30/398
Inventor 张进宇吴大可刘强周振亚
Owner 北京华大九天科技股份有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com