Object three-dimensional measurement system and measurement method based on structured light
A technology of three-dimensional measurement and measurement system, applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of oblique trigonometry, such as complex implementation, limited application scenarios, and inability to meet different application scenarios, and achieve simple structure and equipment Effect of simple maintenance and simplified refraction compensation model
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[0057] The present invention will be further described below in conjunction with the accompanying drawings and specific preferred embodiments, but the protection scope of the present invention is not limited thereby.
[0058] Such as image 3 As shown, the object three-dimensional measurement system based on structured light in this embodiment includes a first parallel plate 1, a second parallel plate 2, and a laser emitting unit 3 for emitting a laser beam based on structured light to the object to be measured. An image acquisition unit 4 for measuring objects for image wiping, the first parallel plate 1 is arranged according to a specified inclination angle and is perpendicular to the direction in which the laser emitting unit 3 emits a laser beam, so that the laser beam emitted by the laser emitting unit 3 is perpendicular to the first parallel plate 1 is emitted, the second parallel plate 2 is placed horizontally and on the same level as the laser emitting unit 3 , and the...
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