Reliability evaluation method and system for different anomalies of SRAM type FPGA

Abstract

The invention discloses a reliability evaluation and system for different anomalies of an SRAM type FPGA. The method includes S100, selecting a configuration memory location, performing a fault-injection test, and counting the error addresses and the number of abnormal bits; S200, evaluating the system according to different anomalies The impact caused by the function is classified, and in S300, different situations are classified and evaluated. The system includes a memory for storing a computer program; a processor for implementing the reliability evaluation method for different exceptions of the SRAM type FPGA as described above when the computer program is executed. The invention solves the quantitative evaluation problem when the single particle flip has different effects on the system function, provides a new solution for the reliability evaluation of the anti-radiation reinforcement design accurately and comprehensively, and has good feasibility and popularization value.

Description

technical field [0001] The invention relates to the field of circuit reliability evaluation, in particular to a reliability evaluation method and system for different anomalies of an SRAM type FPGA. Background technique [0002] Since the 21st century, under the background of the sharp increase in the demand for space signal processing capability and the shortening of the development cycle of space missions, space electronic instruments have put forward high demands for high-performance, short-cycle, low-cost processors and large-scale integrated circuits. Among them, the most critical is to solve the problem of reliable operation of semiconductor integrated circuits in spacecraft in the space radiation environment full of high-energy particles. Compared with traditional aerospace-grade devices, SRAM (Static Random Access Memory) type FPGA (Field Programmable Gate Array) has the characteristics of high information density, high performance, low development cost and reprogram...

AI Technical Summary

Problems solved by technology

The existence of this special phenomenon makes it impossible to comprehensively and accurately evaluate the reliability of SRAM-type FPGA reinforcement design based on the evaluation index based on the flip cross section.

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