Infrared image defect edge detection method based on improved mathematical morphology
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- KUNMING UNIV OF SCI & TECH
- Publication Date
- 2021-06-22
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Abstract
Description
technical field
[0001] The invention relates to an infrared image defect edge detection method based on improved mathematical morphology, which belongs to the fields of non-destructive testing and image recognition. Background technique
[0002] Due to the continuous change and update of today's science and technology, the application of non-destructive testing technology in the field of modern industrial testing is becoming more and more common. Non-destructive testing technology is an indispensable technology in various fields. Non-destructive testing is the detection of the state of equipment test pieces, which can reduce accidents to a certain extent. Non-destructive testing technology can also effectively prevent various economic losses caused by equipment damage. It is of great significance to improve product quality and provide important guarantees for the safe operation of engineering equipment in actual production and life.
[0003] The actual engineering environm...