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Method, system and device for fault location

A fault location and fault technology, applied in special data processing applications, text database query, unstructured text data retrieval, etc., can solve the problem of low fault location accuracy and achieve the effect of improving accuracy

Active Publication Date: 2021-07-02
QINGDAO HAIER TECH +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] Embodiments of the present disclosure provide a method, system and device for fault location to solve the technical problem of low fault location accuracy

Method used

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  • Method, system and device for fault location
  • Method, system and device for fault location
  • Method, system and device for fault location

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Embodiment Construction

[0032] In order to understand the characteristics and technical content of the embodiments of the present disclosure in more detail, the implementation of the embodiments of the present disclosure will be described in detail below in conjunction with the accompanying drawings. The attached drawings are only for reference and description, and are not intended to limit the embodiments of the present disclosure. In the following technical description, for purposes of explanation, numerous details are set forth in order to provide a thorough understanding of the disclosed embodiments. However, one or more embodiments may be practiced without these details. In other instances, well-known structures and devices may be shown simplified in order to simplify the drawings.

[0033] The terms "first", "second" and the like in the description and claims of the embodiments of the present disclosure and the above drawings are used to distinguish similar objects, and are not necessarily used...

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Abstract

The invention relates to the technical field of communication technology and data mining, and discloses a method for fault location. According to the method, for a fault processing request, target fault type information matched with the fault processing request and a corresponding information category used for fault diagnosis are inquired in a fault information base, by obtaining fault description information corresponding to the information category associated with the target fault type information submitted by a client, a target Bayesian network branch with the highest matching degree with the fault description information is determined from the Bayesian networks associated with the target fault type information, and the fault sub-type information associated with the target Bayesian network is fault location. The fault is positioned in a manner of calculating the target Bayesian network branch with the highest matching degree with the fault description information in the Bayesian network associated with the target fault type information in the server, so that the accuracy of fault positioning is improved. The invention also discloses a device for fault location.

Description

technical field [0001] The present application relates to the fields of communication technology and data mining technology, for example, to a method, system and device for fault location. Background technique [0002] At present, when users encounter problems in many fields, such as finance, communication, and smart home appliances, they can use the customer service hotline to communicate with customer service one-on-one to solve the problems encountered by users; or, users can also By accessing the application (Application, App) to find a solution to the problem, that is to say, the user can judge based on the problem diagnosis and processing system provided by the App background or a series of troubleshooting processes based on past experience. The problems they encounter and obtain the corresponding solutions to the problems. [0003] However, the first solution has high labor costs and learning costs. As the business involved becomes more complex or the technical thres...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F16/33G06F16/35G06F16/36G06K9/62
CPCG06F16/334G06F16/353G06F16/36G06F18/24155Y04S10/52
Inventor 陈长运
Owner QINGDAO HAIER TECH
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