Tire X-ray image impurity defect detection method

A defect detection and X-ray technology, which is applied in the field of impurity defect detection in tire X-ray images based on improved YOLOv4-tiny, can solve the problems of defects and low background detection, imperfection, and low efficiency of artificial naked eye detection, so as to avoid defect errors Judgment, the effect of reducing the cost of testing

Inactive Publication Date: 2021-07-02
QINGDAO UNIV OF SCI & TECH
View PDF3 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, domestic tire manufacturers mainly rely on imported foreign X-ray machines to assist manual tire quality assessment. Due to the blockade of foreign technology, the corresponding domestic tire defect automatic detection algorithm is not perfect, and a few enterprises still mainly use manual naked eye detection. The efficiency of artificial naked eye detection is low, and it is greatly affected by human subjectivity
Due to the complex background of tire multi-texture anisotropy, the defects have different shapes, and the defects account for less than 1% of the texture background, which poses challenges for the detection of defects.
[0004] The existing tire defect algorithms are mainly traditional defect detection algorithms, which are mainly divided into statistics-based algorithms, frequency-domain-based algorithms and model-based algorithms. At the same time, it is difficult for the algorithm to detect defects and defects with low background contrast, such as the detection of impurity defects located on the tread, and the detection efficiency of the entire tire X-ray image is low, which cannot meet the industrial real-time requirements. testing requirements

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Tire X-ray image impurity defect detection method
  • Tire X-ray image impurity defect detection method
  • Tire X-ray image impurity defect detection method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0059] Such as Figure 1-14 As shown, the present invention provides a kind of tire X-ray image impurity defect detection method based on improving YOLOv4-tiny, comprises the following steps:

[0060] S1. Intercepting 416*416 images containing impurities from the X-ray tire image of 2469*11400 collected by the X-ray machine to establish a data set;

[0061] S11. Use an X-ray machine to scan the inner circle of the tire at 360°. Due to the differences in the material and density of the material and density between the impurities and the normal tread, the degree of absorption of the rays will be different, resulting in the uniformity of the rays passing through the workpiece. Form a light and dark image on the film, and receive the image through a computer. The image is a tire X-ray image with a size of 2469*11400. These images include normal and defective tire X-ray images, and the tires containing impurities and defects are selected from these images. X-ray images, intercepti...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a tire X-ray image impurity defect detection method. The method comprises the following steps: S1, establishing an image data set containing impurity defects; s2, enhancing the data set by using rotation, mirroring and brightness transformation; s3,building an improved YOLOv4-tiny network; s4, setting hyper-parameters and network parameters for training; s5, inputting a to-be-detected image to carry out defect detection. According to the invention, end-to-end tire impurity defect positioning is realized, the requirement of real-time tire defect detection can be met, and the production efficiency is greatly improved.

Description

technical field [0001] The invention relates to a method for detecting impurity defects in tire X-ray images, in particular to a method for detecting impurity defects in tire X-ray images based on improved YOLOv4-tiny. Background technique [0002] In recent years, with the improvement of living standards, the number of cars in my country has increased year by year, and it is expected to surpass the United States in 2021 to become the country with the largest number of cars in the world. As a necessary means of transportation for people to travel, cars play an indispensable role in people's lives. [0003] As the main part of the car, the tire is also the only part of the car that is in contact with the ground. It is responsible for alleviating impact and carrying the weight of the car. The quality of tires is related to the safety of drivers. At present, domestic tire manufacturers mainly rely on imported foreign X-ray machines to assist manual tire quality assessment. Du...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06N3/04G06N3/08G06K9/62
CPCG06T7/0004G06N3/08G06T2207/10116G06T2207/20081G06T2207/20084G06N3/045G06F18/23213
Inventor 张岩郑洲洲赵蒙蒙孙英伟常艳康
Owner QINGDAO UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products