Multi-controller combined hardware-in-loop test system and method

Abstract

The invention discloses a multi-controller combined hardware-in-the-loop testing system and method, and belongs to the technical field of vehicle testing. A real-time operation module, a test module, a fault injection module and a tested controller module are connected in sequence, the real-time operation module is connected with the fault injection module, and the tested controller module comprises a power-assisted steering controller, a chassis controller, an engine controller and a gearbox controller, which are connected with one another. The real-time operation module obtains sensing signals corresponding to the controllers according to vehicle model signals and generates operation condition signals according to the sensing signals, the test module generates sensor characteristic signals according to the operation condition signals, and the fault injection module generates fault test signals according to the sensor characteristic signals. The tested controller module tests each controller according to the fault test signal and generates a test signal, the real-time operation module realizes multi-controller test according to the test signal, and the combined operation of the multiple controllers improves the vehicle hardware-in-the-loop test coverage.

Description

technical field [0001] The invention relates to the technical field of vehicle testing, in particular to a multi-controller combined hardware-in-the-loop testing system and method. Background technique [0002] With the development of intelligent automobiles in China, the application of bus technology and the large-scale use of electronic control units (Electronic Control Unit, ECU) make the hardware-in-the-loop test (HIL) demand Also getting bigger and bigger. Hardware-in-the-loop testing is one of the indispensable links in the whole vehicle development process. Hardware-in-the-loop testing can be used to test some extreme conditions, so as to avoid the risk of real vehicle testing. At present, the hardware-in-the-loop test solution mainly focuses on the test of the single-node controller to obtain the functional test results of a single ECU, which makes the coverage of the whole vehicle hardware-in-the-loop test low. The above content is only used to assist in understan...

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Problems solved by technology

[0003] The main purpose of the present invention is to provide a multi-controller combined hardware-in-the-loop test system and method, aiming to solve the problem that the hardware-in-the-loop test scheme in the prior art mainly focuses on the test of a single node controller, so that the whole vehicle hardware-in-the-loop test Technical issues with low coverage

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